DLTS method using a single temperature scanning

Abstract

A method of DLTS with only one temperature raising is described end discussed. It allows to obtain the activation energy of deep trap emission probability not only from detached DLTS responses but also from partially superimposed responses. Besides it is shown that reducing the overlapping of such responses is possible. A simple and low-cost experimental arrangement is set up.. Une procbdme d'exploitation de la DLTS B une seule remontbe de temperature est dbcrite et discutbe. Elle permet d'obtenir l'bnergie d'activation de la probabilitb d'bmission des pikges profonds non seulement pour des rbponses DLTS isoltks, mais aussi pour des rbponses partiellement superposbes. On montre d'ailleurs qu'il est possible de diminuer le recouvrement de telles rbponses. Un montage expbrimental simple e t relativement peu couteux est proposb.

Direct nm-Scale Spatial Mapping of Traps in CIGS

“…Arrhenius analysis of 1/kT versus ln(τ T 2 ) is then used to extract E T − E V and σ p . The time constant is determined either by isothermal double boxcar analysis and/or by exponential fitting [21].…”

A modified method of side data analysis of deep level transient spectroscopy spectra

“…[1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17] DLTS uses capacitance, voltage, or current transient signals resulting from relaxation processes following an abrupt change of the bias voltage or light applied to the investigated structure. These measurement modes are called constant voltage ͑CV͒ DLTS, constant capacitance ͑CC͒ DLTS, and current DLTS, respectively.…”

“…[7][8][9][10][11][12][13][14][15][16][17] Two kinds of side data analysis of CV and CC DLTS spectra have been proposed ͑we do not deal with DLTS methods utilizing the Fourier transformation͒. The first type utilizes the normalized DLTS spectrum with regard to the maximum value of the DLTS signal, i.e., the ratio of ⌬C͑t 1 ,t 2 ,T ͒/⌬C͑ t 1 ,t 2 ,T max ͒ measured at the different temperatures, to determine deep level parameters.…”

“…The first type utilizes the normalized DLTS spectrum with regard to the maximum value of the DLTS signal, i.e., the ratio of ⌬C͑t 1 ,t 2 ,T ͒/⌬C͑ t 1 ,t 2 ,T max ͒ measured at the different temperatures, to determine deep level parameters. [7][8][9][10][11][12][13][14][15] The drawbacks of this analysis are:…”

Single scan deep-level transient spectroscopy

“…[1][2][3][4] These techniques are based on using the traditional deep-level transient spectroscopy (DLTS) data collection method in which the transient signal is sampled at two times, tl and t 2 • Most of these methods l -3 involve the numerical solution of a complex function and these methods have not gained general acceptance. [1][2][3][4] These techniques are based on using the traditional deep-level transient spectroscopy (DLTS) data collection method in which the transient signal is sampled at two times, tl and t 2 • Most of these methods l -3 involve the numerical solution of a complex function and these methods have not gained general acceptance.…”