2001
DOI: 10.1116/1.1385910
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Doping of amorphous and microcrystalline silicon films deposited at low substrate temperatures by hot-wire chemical vapor deposition

Abstract: Electronic and structural properties of doped amorphous and nanocrystalline silicon deposited at low substrate temperatures by radio-frequency plasma-enhanced chemical vapor deposition Amorphous and microcrystalline silicon films grown at low temperatures by radio-frequency and hot-wire chemical vapor depositionThe gas phase doping of amorphous ͑a-Si:H͒ and microcrystalline (c-Si:H͒ silicon thin films deposited at substrate temperatures of 25°C and 100°C by hot-wire chemical vapor deposition is studied. Phosph… Show more

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Cited by 35 publications
(11 citation statements)
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References 28 publications
(24 reference statements)
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“…The deposition parameters are a pressure of 500 mTorr, an absorbed power of 103 mW/cm 2 , and a hydrogen dilution ratio of [17]. With other deposition parameters fixed, higher electrical conductivities are obtained when the film is deposited at 80 MHz excitation frequency than at 13.56 MHz frequency.…”
Section: Deposition Of Nanocrystalline Silicon Filmsmentioning
confidence: 94%
“…The deposition parameters are a pressure of 500 mTorr, an absorbed power of 103 mW/cm 2 , and a hydrogen dilution ratio of [17]. With other deposition parameters fixed, higher electrical conductivities are obtained when the film is deposited at 80 MHz excitation frequency than at 13.56 MHz frequency.…”
Section: Deposition Of Nanocrystalline Silicon Filmsmentioning
confidence: 94%
“…Highly crystalline silicon thin films can accommodate a larger number of electrically active dopant atoms, compared to purely amorphous ones, as also evidenced by their higher conductivity (see for instance 52 and Supplementary Table 1). For this, we explored deposition conditions similar to those fostering nanocrystalline silicon thin-film growth [53][54][55] and silicon epitaxy 56 , hence characterized by a considerably lower silane concentration in the deposition plasma than conventional doped a-Si:H layers.…”
Section: Requirements For E Cient Tunnel-ibc Solar Cellsmentioning
confidence: 96%
“…A particularly interesting low‐temperature (<200 °C) approach lies in using hydrogenated nanocrystalline silicon (nc‐Si:H), deposited by plasma‐enhanced chemical vapor deposition (PECVD) employing silane gas with high hydrogen dilution . By adding either trimethylboron or phosphine to the silane/hydrogen mixture in the reactor, highly doped nc‐Si:H can be obtained, which is required for recombination junctions exhibiting low resistance and narrow‐potential energy barrier widths. Such nc‐Si:H layers have recently been used for high‐efficiency SHJ solar cells in both‐sides‐contacted and back‐contacted configurations …”
Section: Introductionmentioning
confidence: 99%