Drive frequency dependent phase imaging in piezoresponse force microscopy

Bo, Huifeng; Kan, Yi; Lü, Xiaomei; Liu, Yunfei; Song, Peng; Wang, Xiaofei; Cai, Wei; Xue, Ruoshi; Zhu, Jinsong

doi:10.1063/1.3474956

Cited by 8 publications

(9 citation statements)

References 23 publications

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“…46 Lithium niobate (LiNbO 3 ) belongs to point group 3m, and therefore the piezoelectric matrix has four independent components: d 15 , 31 , and d 33 . 47 The vertical PFM signal far away from domain walls contains contributions from all four components, as described by Lei et al, 48 but is dominated by the d 33 and d 15 contributions.…”

Section: Frequency Dependent Imagingmentioning

confidence: 99%

“…31 However, it is well known that the drive frequency of the electrical excitation can have a profound effect on the measured PFM signal, 32,33 with at least part of the frequency dependence due to the contact resonance of the cantilever. 34 Since the contact resonance frequency depends on the contact stiffness of the tip-sample interaction, as the contact area changes while the cantilever scans over the surface, operating too close to the cantilever resonance can lead to artifacts in the response.…”

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confidence: 99%

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In-situ piezoresponse force microscopy cantilever mode shape profiling

Proksch

2015

Journal of Applied Physics

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The frequency-dependent amplitude and phase in piezoresponse force microscopy (PFM) measurements are shown to be a consequence of the Euler-Bernoulli (EB) dynamics of atomic force microscope (AFM) cantilever beams used to make the measurements. Changes in the cantilever mode shape as a function of changes in the boundary conditions determine the sensitivity of cantilevers to forces between the tip and the sample. Conventional PFM and AFM measurements are made with the motion of the cantilever measured at one optical beam detector (OBD) spot location. A single OBD spot location provides a limited picture of the total cantilever motion and in fact, experimentally observed cantilever amplitude and phase are shown to be strongly dependent on the OBD spot position for many measurements. In this work, the commonly observed frequency dependence of PFM response is explained through experimental measurements and analytic theoretical EB modeling of the PFM response as a function of both frequency and OBD spot location on a periodically poled lithium niobate (PPLN) sample. One notable conclusion is that a common choice of OBD spot location -at or near the tip of the cantilever -is particularly vulnerable to frequency dependent amplitude and phase variations stemming from dynamics of the cantilever sensor rather than from the piezoresponse of the sample.

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Section: Frequency Dependent Imagingmentioning

confidence: 99%

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confidence: 99%

In-situ piezoresponse force microscopy cantilever mode shape profiling

Proksch

2015

Journal of Applied Physics

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“…However, it is well known that the drive frequency of the electrical excitation can have a profound effect on the measured signal. 7,8 Since the frequency response of most ferroelectric samples should be flat into the GHz range, 9 this suggests that some features in the frequency response into the MHz range may originate from cantilever dynamics instead of ferroelectric effects. 10,11 In order to minimize the effects of cantilever resonances on the ferroelectric signal, singlefrequency PFM has mostly been limited to operation at a few hundred kHz or lower, 12 with some exceptions.…”

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confidence: 99%

Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

Labuda¹,

Proksch²

2015

Applied Physics Letters

100

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An ongoing challenge in atomic force microscope (AFM) experiments is the quantitative measurement of cantilever motion. The vast majority of AFMs use the optical beam deflection (OBD) method to infer the deflection of the cantilever. The OBD method is easy to implement, has impressive noise performance and tends to be mechanically robust. However, it represents an indirect measurement of the cantilever displacement, since it is fundamentally an angular rather than a displacement measurement. Here, we demonstrate a metrological AFM that combines an OBD sensor with a laser Doppler vibrometer (LDV) to enable accurate measurements of the cantilever velocity and displacement. The OBD/LDV AFM allows a host of quantitative measurements to be performed, including in-situ measurements of cantilever oscillation modes in piezoresponse force microscopy (PFM). As an example application, we demonstrate how this instrument can be used for accurate quantification of piezoelectric sensitivity -a longstanding goal in the electromechanical community.

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“…In order to map the domain structure and identify the polarization direction of PPLN, we first performed a slow off-resonance PFM scan, since the absolute phase of piezoresponse at the contact resonance is not well defined, and resonance-enhanced imaging at higher frequencies can change the piezoresponse due to the dynamics of cantilever or instrumental lags [33][34][35]. Away from the resonance, however, the polarization direction can be deduced directly from the piezoresponse phase signal measured [24].…”

Section: Resultsmentioning

confidence: 99%

Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis

Esfahani

Liu

2017

Journal of Materiomics

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Local domain structures of ferroelectrics have been studied extensively using various modes of scanning probes at the nanoscale, including piezoresponse force microscopy (PFM) and Kelvin probe force microscopy (KPFM), though none of these techniques measure the polarization directly, and the fast formation kinetics of domains and screening charges cannot be captured by these quasi-static measurements. In this study, we used charge gradient microscopy (CGM) to image ferroelectric domains of lithium niobate based on current measured during fast scanning, and applied principal component analysis (PCA) to enhance the signal-to-noise ratio of noisy raw data. We found that the CGM signal increases linearly with the scan speed while decreases with the temperature under power-law, consistent with proposed imaging mechanisms of scraping and refilling of surface charges within domains, and polarization change across domain wall. We then, based on CGM mappings, estimated the spontaneous polarization and the density of surface charges with order of magnitude agreement with literature data. The study demonstrates that PCA is a powerful method in imaging analysis of scanning probe microscopy (SPM), with which quantitative analysis of noisy raw data becomes possible.

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Drive frequency dependent phase imaging in piezoresponse force microscopy

Cited by 8 publications

References 23 publications

In-situ piezoresponse force microscopy cantilever mode shape profiling

In-situ piezoresponse force microscopy cantilever mode shape profiling

Quantitative measurements of electromechanical response with a combined optical beam and interferometric atomic force microscope

Imaging ferroelectric domains via charge gradient microscopy enhanced by principal component analysis

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