Dynamic models of external capacitors to perform accurate EMC and ESD simulations

Baptistat, N.; Abouda, K.; Doridant, A.; Vrigon, B.; Dubois, Tristan

doi:10.1109/emceurope.2017.8094650

Cited by 3 publications

(2 citation statements)

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“…Even if this approach is sufficient to measure the resistance or capacitance shift, the impact on complex impedance remains unknown. [9] exposes two techniques, based on TLP measurement, to model the capacitance variation due to capacitor bias. It permits to model the transient response of a capacitor to ESD discharge without any frequency measurement.…”

Section: Introductionmentioning

confidence: 99%

New measurement method to investigated service life of protection networks exposed to ESD

Ruffat

Caignet

Boyer

et al. 2022

Microelectronics Reliability

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Section: Introductionmentioning

confidence: 99%

New measurement method to investigated service life of protection networks exposed to ESD

Ruffat

Caignet

Boyer

et al. 2022

Microelectronics Reliability

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“…CAPACITORS are widely applied in circuits for decoupling, filtering and electromagnetic interference suppression purposes. Therefore, they play a vital role in electromagnetic compatibility (EMC)) performance [1,2]. However, after a long-time operation, degradation mechanisms can have a significant negative impact on the capacitor parameters, such as the capacitance and the equivalent series resistance (ESR).…”

Section: Introductionmentioning

confidence: 99%

A novel full-parameter ageing modelling approach for capacitors based on complex impedance analysis

Líu

Vandenbosch

Claeys

et al. 2020

IEEE Trans. Dielect. Electr. Insul.

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Capacitors are ubiquitous in electronic devices and play a critical role in the devices' electromagnetic compatibility performance. The ageing of capacitors, due to intrinsic degradation mechanisms and external thermal and electrical stresses, has drawn a wide attention in the reliability field. The variations of the capacitance and equivalent series resistance are typically seen as representative for the ageing of capacitors, while the other parasitic parameters are usually neglected. In this study, a new full-parameter ageing modelling approach of capacitors is proposed based on complex impedance analysis. The ageing characteristics of all the proposed 7 parameters, including all parasitic parameters, are identified by carrying out an electrical overstress accelerated ageing test.

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Characterizing EMI-filters’ Deviations caused by the Capacitors Ageing based on Complex Impedance Analysis

Líu

Claeys

Pissoort

et al. 2020

2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE

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Dynamic models of external capacitors to perform accurate EMC and ESD simulations

Cited by 3 publications

References 0 publications

New measurement method to investigated service life of protection networks exposed to ESD

New measurement method to investigated service life of protection networks exposed to ESD

A novel full-parameter ageing modelling approach for capacitors based on complex impedance analysis

Characterizing EMI-filters’ Deviations caused by the Capacitors Ageing based on Complex Impedance Analysis

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