2015
DOI: 10.1016/j.actamat.2014.08.048
|View full text |Cite
|
Sign up to set email alerts
|

Dynamic response of thin films on substrates subjected to femtosecond laser pulses

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2015
2015
2021
2021

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 7 publications
(3 citation statements)
references
References 39 publications
0
3
0
Order By: Relevance
“…In this work, we used a femto-second pulse laser (FS laser), which is capable of 3D processing without thermal effects and shape limitations [14][15][16]. In FS laser processing, the pulse width of the laser is shorter than the heat propagation time of the material, thus preventing thermal damage and structural changes in the material.…”
Section: Low-cost Mass Fabricating Rgmpsmentioning
confidence: 99%
“…In this work, we used a femto-second pulse laser (FS laser), which is capable of 3D processing without thermal effects and shape limitations [14][15][16]. In FS laser processing, the pulse width of the laser is shorter than the heat propagation time of the material, thus preventing thermal damage and structural changes in the material.…”
Section: Low-cost Mass Fabricating Rgmpsmentioning
confidence: 99%
“…As shown in Figure 1, the sequential techniques consist of three processes. The first is casting and packaging of microwire, [12,13] the second is an ultrashort laser cutting process, [14][15][16] and the third involves surface chemistry. [17,18] Low-cost, large-scale, and continuous product processes for GMGPs are suitable for the industrialization stage of functional magnetic particles, such as general binding matrix for immunoassays.…”
Section: Doi: 101002/adem202000060mentioning
confidence: 99%
“…Femtosecond laser ablation is useful for many applications such as the creation of nanoparticles [1], thin film deposition [2], micromachining [3][4][5], 3D tomography [6], microfluidics [4,7], and 1 davidjjorgensen@engr.ucsb.edu, fax:(805) 893-8486 measuring the properties of thin films on substrates [8]. Paramount to all of these techniques is a detailed understanding of the fluence-ablation relationship of the materials systems.…”
Section: Introductionmentioning
confidence: 99%