Efecto de la temperatura en la estructura y morfología de recubrimientos de (Ti Al)N

Salamanca, Mónica E.; Benavides, Victor Javier; Arango, Y.C.

doi:10.15765/e.v3i3.414

Cited by 2 publications

(2 citation statements)

References 8 publications

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“…The images obtained in each sample were done by tracking continuous areas of the samples, the subsequent analysis, showed the characteristics of the roughness at nano-scale, corroborating the correlation that exists between the roughness of the materials and its conductivity. It can be inferred that the conductivity of the materials is affected by the roughness, as has been demonstrated in preliminary works [33,35].…”

Section: Atomic Force Microscopymentioning

confidence: 52%

Mathematical modelling of the conductivity in CZTiS-CZSnS as a function of synthesis temperature

Mesa

Báez

Cerón-Achicanoy

et al. 2021

J. Phys.: Condens. Matter

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The electrical behavior of photovoltaic materials related with Cu2ZnTiS4 and Cu2ZnSnS4 materials were analyzed as function of synthesis temperature in accordance with a new mathematical model based on the Kramers–Kronig equations with a high reliability. The samples were obtained through a hydrothermal route and a subsequent thermal treatment of solids at 550 °C for 1 h under nitrogen flow (50 ml min−1). The characterization was done by x-ray diffraction, ultraviolet spectroscopy (UV), Raman spectroscopy, atomic force microscopy (AFM) and solid state impedance spectroscopy (IS) techniques. The structural characterization, confirm the obtention of a tetragonal material with spatial group I-42m, oriented along (1 1 2) facet, with nanometric crystal sizes (5–6 nm). The AFM and Raman analysis confirm a high level of chemical homogeneity and correlation with the synthesis temperature, associated with the roughness of the samples. The UV spectroscopy confirm a band gap around 1.4–1.5 eV, evidencing the effectiveness of the synthesis process. The IS results at room temperature with a probability of 95%, confirm a high consistency of data with respect to values of real and imaginary impedance, allowing to obtain information of the conductance, reactance and inductance, achieving conductivity values around 10−5 and 10−3 Ω−1 m−1 in comparison with traditional mathematical models used for this purpose.

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Section: Atomic Force Microscopymentioning

confidence: 52%

Mathematical modelling of the conductivity in CZTiS-CZSnS as a function of synthesis temperature

Mesa

Báez

Cerón-Achicanoy

et al. 2021

J. Phys.: Condens. Matter

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“…This confirms that at a higher synthesis temperature, materials with higher purity and fewer structural defects can be obtained (9). The ECS Transactions, 100 (1) 37-44 (2021) morphological characteristics of each CZTiS specimen were achieved by means of Atomic Force Miscroscopy of each sample (Figure 4), whose measurements were taken continuously in contact mode on the surface, allowing to visualize a correlation between the roughness of the sample and its electrical properties as a function of the synthesis temperature (16)(17).…”

Section: Characterizationmentioning

confidence: 99%

Mathematical Models to Determine the Conductivity of a Cztis Photovoltaic Material as a Function of the Synthesis Temperature

et al. 2021

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Study on the conductivity of the material Cu2ZnTiS4 (CZTiS), obtained under a hydrothermal route from precursor nitrates treated in a teflon reactor under constant pressure with a stainless steel jacket, involving different heat treatments (200, 225, 250, 275 and 300°C) for reaction times of 48 hours in all cases and subsequent calcination at 550°C in a tube oven, under nitrogen flow (50 mL min-1). The materials were characterized by X-ray Diffraction (XRD), Raman spectroscopy, Scanning Electron Microscopy (SEM), and Atomic Force Microscopy (AFM). The results showed materials with structural and crystalline properties concordant with a kesterite type phase, evidencing homogeneous surfaces, unique morphological properties derived from the process with regular distribution of particles and size of the nanometric order (5-6 nm) as well as the characteristics of the roughness of the material. Solid state impedance spectroscopy (IS) evidenced its electrical behavior and validated the proposed mathematical models.

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Efecto de la temperatura en la estructura y morfología de recubrimientos de (Ti Al)N

Cited by 2 publications

References 8 publications

Mathematical modelling of the conductivity in CZTiS-CZSnS as a function of synthesis temperature

Mathematical modelling of the conductivity in CZTiS-CZSnS as a function of synthesis temperature

Mathematical Models to Determine the Conductivity of a Cztis Photovoltaic Material as a Function of the Synthesis Temperature

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