2019
DOI: 10.1088/2053-1591/ab198c
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Effect of crystallinity of PAN-based carbon fiber surfaces on the formation characteristics of silicon carbide coating

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Cited by 17 publications
(6 citation statements)
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“…Moreover, the lower peak at 2θ = 45°, corresponding to the (100) plane of the graphite layers, appears in the XRD pattern of CF. According to previous studies, the prepared CF can be assigned to amorphous carbon structure 27,28 . The XRD pattern of nano‐coral W 2 C shows various sharp peaks.…”
Section: Resultsmentioning
confidence: 83%
See 1 more Smart Citation
“…Moreover, the lower peak at 2θ = 45°, corresponding to the (100) plane of the graphite layers, appears in the XRD pattern of CF. According to previous studies, the prepared CF can be assigned to amorphous carbon structure 27,28 . The XRD pattern of nano‐coral W 2 C shows various sharp peaks.…”
Section: Resultsmentioning
confidence: 83%
“…According to previous studies, the prepared CF can be assigned to amorphous carbon structure. 27,28 The XRD pattern of nano-coral W 2 C shows various sharp peaks. The highest peak located at 2θ = 25.9 can be ascribed to the (002) plane of graphite.…”
Section: Resultsmentioning
confidence: 99%
“…The GIXRD patterns of the as-prepared films of the uncoated Toray paper and of the pristine TiN powder are shown in Figure S5. Pure Toray paper shows only one strong peak at 2θ = 30.7°c orresponding to the peak of pure graphite, 73,74 while both TiN/ NF@Toray-pristine and Toray-irr show strong signal belonging to the Toray paper and the characteristic diffraction peaks of TiN. 75,76 The Raman spectrum (Figure 1e) of TiN/NF@Toray-irr shows two broad peaks centered at 1350 and 1585 cm −1 , which can be attributed to the D and G bands, respectively, both bands being absent in TiN/NF@Toray-pristine.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…Previous studies reported that PAN‐based carbon fiber reacted with molten silicon to form β ‐SiC at 1500 °C, and SiC crystals were precipitated from the carbon solution in liquid silicon during high temperatures, rather than after cooling. [ 38 ] Figure 9b shows that the diffraction peak intensity of SiC increased with the increase of CCF content due to the increase of the β ‐SiC phase formed by the silicon carbon reaction. At the same time, an increase in the diffraction peak intensity of amorphous carbon was also observed, which was due to the incomplete reaction of silicon and carbon.…”
Section: Resultsmentioning
confidence: 99%