2012
DOI: 10.1016/j.msea.2012.05.086
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Effect of iron and indium on IMC formation and mechanical properties of lead-free solder

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Cited by 53 publications
(21 citation statements)
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“…Thus, the addition of indium further lowers the melting temperature of Sn-Zn-Bi solder and makes it rather closer to that of Sn-37Pb. Similar results, demonstrating the effect of In addition on the thermal properties of Sn-Ag-Cu and Sn-CuNi solder alloys have been reported [14,15,17].…”
Section: Thermal Analysissupporting
confidence: 88%
“…Thus, the addition of indium further lowers the melting temperature of Sn-Zn-Bi solder and makes it rather closer to that of Sn-37Pb. Similar results, demonstrating the effect of In addition on the thermal properties of Sn-Ag-Cu and Sn-CuNi solder alloys have been reported [14,15,17].…”
Section: Thermal Analysissupporting
confidence: 88%
“…Reducing the CTE of the solder improved the resistance to thermomechanical fatigue. This is because it reduced thermal or residual stress, one of the causes of fatigue [40]. The CTE mismatch between packaging materials may lead to various types of failure during manufacturing processes [40].…”
Section: Pointsmentioning
confidence: 99%
“…This is because it reduced thermal or residual stress, one of the causes of fatigue [40]. The CTE mismatch between packaging materials may lead to various types of failure during manufacturing processes [40]. Reducing CTE could also increase the shear strength, as a result of microstructure refinement [40].…”
Section: Pointsmentioning
confidence: 99%
“…The elements of the selected surface are listed in Table 4, together with their respective phases as identified according to the Sn-Cu phase diagram [31]. Basically, the Cu atoms of IMC phase migrated from SAC305 solder alloy and the Cu substrate to form Cu 6 Sn 5 phase joining interface [32,33]. As seen in Figure 11a-c, the growth of an elongated scallop-liked layer of Cu 6 Sn 5 phase at SAC305/Cu substrate interface was observed for the sample soldered at 307 • C and 300 s with and without the addition of porous Cu.…”
Section: Interfacial Structure Analysismentioning
confidence: 99%