1995
DOI: 10.4028/www.scientific.net/msf.192-194.225
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Effect of pH on Electrochemical Behaviour and Passive Film Composition of Stainless Steels

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Cited by 29 publications
(29 citation statements)
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“…Secondary ion mass spectroscopy (SIMS) and depth profiling by Auger electron spectroscopy and XPS could provide an accurate estimate of the overlayer thickness, but these methods are destructive. Alternately, the overlayer thickness can be determined non-destructively by XPS 53,54,[59][60][61][62][63][64][65] . Since most NEXAFS endstations at modern synchrotron facilities include XPS spectrometers, the calculation of the overlayer thickness can be performed by acquiring XPS spectra in the same experimental chamber, thus avoiding any risk of changing the composition and thickness of the contamination layer upon transferring the sample to a dedicated XPS chamber.…”
Section: Resultsmentioning
confidence: 99%
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“…Secondary ion mass spectroscopy (SIMS) and depth profiling by Auger electron spectroscopy and XPS could provide an accurate estimate of the overlayer thickness, but these methods are destructive. Alternately, the overlayer thickness can be determined non-destructively by XPS 53,54,[59][60][61][62][63][64][65] . Since most NEXAFS endstations at modern synchrotron facilities include XPS spectrometers, the calculation of the overlayer thickness can be performed by acquiring XPS spectra in the same experimental chamber, thus avoiding any risk of changing the composition and thickness of the contamination layer upon transferring the sample to a dedicated XPS chamber.…”
Section: Resultsmentioning
confidence: 99%
“…With X-ray photoelectron spectroscopy (XPS), the composition and thickness of each layer constituting a multilayer system can be determined without applying any destructive technique 53,54,[59][60][61][62][63][64][65] . However, no methodology for extracting the photo-absorption spectrum of a single layer within a multilayer structure has ever been reported for NEXAFS spectroscopy in the literature.…”
Section: Introductionmentioning
confidence: 99%
“…The passivation of SS is a complex process influenced by several parameters, such as the alloy composition, the environment, and the conditions of passive layer formation [1][2][3][4][5][6]. The electrochemical properties of passive SS have been widely studied from passive layers grown under controlled conditions (potentiostatic or potentiodynamic tests) [6][7][8][9].…”
Section: Introductionmentioning
confidence: 99%
“…The SS surface has a passive film consisting mainly of oxides and hydroxides of chromium and iron. 24,25) Upon contact with an aqueous solution, the hydroxyl groups (M-OH) can be positively charged by protonation (M-OH 2 þ ) at low pH values and negatively charged by deprotonation (M-O À ) at high pH values. 26) The apparent point of zero charge has been reported to be at pH 8.5 for SS of type 316L.…”
Section: Adsorption Behavior In Different Types Of Buffer Solutionmentioning
confidence: 99%