2019
DOI: 10.1007/s10854-019-02224-w
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Effect of rare-earth Pr6O11 insulating layer on the electrical properties of Au/n-GaN Schottky electrode and its chemical and structural characterization

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Cited by 12 publications
(2 citation statements)
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“…The plateau at reverse bias provides insight into R sh , whereas the plateau at forward voltage represents the value of R s . [ 81 ] Notice that V GS applied to the EGVFET resulted in a slight difference between the forward I–V curves, and consequently, R s is weakly changed, evidenced in the zoom presented in the inset of Figure 3c. On the other hand, the parallel contribution is drastically modified upon increasing V GS .…”
Section: Resultsmentioning
confidence: 99%
“…The plateau at reverse bias provides insight into R sh , whereas the plateau at forward voltage represents the value of R s . [ 81 ] Notice that V GS applied to the EGVFET resulted in a slight difference between the forward I–V curves, and consequently, R s is weakly changed, evidenced in the zoom presented in the inset of Figure 3c. On the other hand, the parallel contribution is drastically modified upon increasing V GS .…”
Section: Resultsmentioning
confidence: 99%
“…Rare earth materials are most frequently employed for MIS-type SBDs because of their broad bandgap and high k-dielectric characteristics. In order to separate the electrical characteristics and current transport methods, some researchers have developed rare-earth-based MIS SBDs [3][4][5][6][7][8]. Also, rare earth ions that have been doped with lanthanum phosphate mostly depend on physical factors such as growth mechanisms, particle size, shape, and dopant percentage [9].…”
Section: Introductionmentioning
confidence: 99%