In this paper, we describe a method that we have developed for studying the behavior of a novel slurry injection system (SIS) during polishing. The method uses sensitive laser measurements and automated image analysis to infer the pitch of the injector body as a function of time under various conditions on a research polisher. The measurements clearly show the pitch response of the injector during typical CMP processing steps, such as pad rinsing and wafer polishing. Changes in pitch behavior as a function of injector design and operation, in combination with removal rate measurements, suggest explanations for the removal rate behavior of the device. One of the issues in chemical mechanical planarization (CMP) is that it can be difficult to gather fundamental data that can be used to understand what is happening during the process. Many of the advances in understanding and subsequent improvements in CMP have come about through innovative metrology. For example, measurements of the friction force between the pad and wafer have provided fundamental information about the lubrication regime of the process.1,2 The same measurements have also been used in end point detection to determine when one layer has been removed and another exposed. Similarly, key advances in our understanding of CMP have come about as a result of the application of pad thermal imaging, 4 measurements of the pressure of the fluid between the wafer and pad, 5,6 capacitance distance measurements of wafer bending and head tilt 7 and confocal microscopy of pad surfaces. 8,9 In this paper, we describe a simple laser tilt measurement system that has been used to monitor the pitch of a novel slurry injection system (SIS). The laser measurements provide some insight into the behavior of the injection system during typical processing procedures, such as pad rinsing and wafer polishing. These insights help explain the important factors underlying the performance of the injector. As a side effect, the measurements also uncover an unsuspected behavior of the polisher.
The Slurry Injection System (SIS)The SIS used in this study, and its performance have been described in detail elsewhere. [10][11][12][13][14] The particular model of the SIS employed here was developed for the AMAT Mirra polisher (Fig. 1). The functional part of the system is the injector body, which is rectangular and has a bottom made of PEEK (polyetheretherketone). The bottom is patterned and flexible and is meant to be held in close contact with the pad using a light load. The system is connected to the polisher through gimbal points that sit well in front of the device and close to the pad surface; these points therefore can apply only small pitching torques to the body. Slurry is applied through one or more tubes that protrude through the cover of the device. The slurry feeds into a narrow open channel in the bottom and is distributed in the radial direction of the polishing pad. Slurry is then advected from the channel by the moving pad surface and emerges from the trailing edge of th...