2013
DOI: 10.1007/s00170-012-4702-2
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Effect of slurry injection position on material removal in chemical mechanical planarization

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Cited by 13 publications
(2 citation statements)
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“…In all these processes, sedimentation and agglomeration of loose abrasives are avoided by maintaining the properties of suspension and by precisely feeding the suspension into the polishing zone. [7][8][9] Consistent results are realised by periodically conditioning the polishing pads used in many polishing methods. 10,11 Some of the drawbacks associated with bonded and loose abrasive finishing methods are overcome by unconventional methods of polishing such as liquid-bonded wheel, frozen magnetic fluid grinding wheel, magnetic-bonded abrasive particles, soft abrasive grinding wheel (SAGW), and sol-gel polishing pads.…”
Section: Introductionmentioning
confidence: 97%
“…In all these processes, sedimentation and agglomeration of loose abrasives are avoided by maintaining the properties of suspension and by precisely feeding the suspension into the polishing zone. [7][8][9] Consistent results are realised by periodically conditioning the polishing pads used in many polishing methods. 10,11 Some of the drawbacks associated with bonded and loose abrasive finishing methods are overcome by unconventional methods of polishing such as liquid-bonded wheel, frozen magnetic fluid grinding wheel, magnetic-bonded abrasive particles, soft abrasive grinding wheel (SAGW), and sol-gel polishing pads.…”
Section: Introductionmentioning
confidence: 97%
“…1,2 The same measurements have also been used in end point detection to determine when one layer has been removed and another exposed. 3 Similarly, key advances in our understanding of CMP have come about as a result of the application of pad thermal imaging, 4 measurements of the pressure of the fluid between the wafer and pad, 5,6 capacitance distance measurements of wafer bending and head tilt 7 and confocal microscopy of pad surfaces. 8,9 In this paper, we describe a simple laser tilt measurement system that has been used to monitor the pitch of a novel slurry injection system (SIS).…”
mentioning
confidence: 99%