Effects of analyte appearance time on relative atomic and ionic emission intensities of Zn in direct sample insertion inductively coupled plasma atomic emission spectrometry

Chan, George C.-Y.; Fan, Mau-Nam; Chan, Wing-Shing

doi:10.1039/b100066g

Cited by 3 publications

(2 citation statements)

References 15 publications

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“…In DSI-ICP-AES, analyte appearance time, shape (width and height) of the analyte peak, SBR, and background intensity depend on the position of the sample probe in the ICP discharge. [1][2][3][4][5][6][7][8][9][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28] Generally, increasing the cup position from a lower position of the ICP (e.g., below the top of the load coil) to a higher position (e.g., above the top of the load coil) gives sharper and more symmetrical analyte emission peaks and, therefore, enhanced SBR. The effects of probe position on plasma excitation conditions, however, are rarely discussed in the literatures.…”

Section: Effect Of Probe Insertion On Plasma Excitation Conditionsmentioning

confidence: 99%

Novel setup for investigation of the plasma conditions in direct sample insertion inductively coupled plasma atomic emission spectrometry (DSI-ICP-AES)

Cheung

Chan

2004

J. Anal. At. Spectrom.

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Insertion of a sample probe into the inductively coupled plasma (ICP) for direct sample insertion (DSI) could change the plasma excitation conditions. In this study, a novel setup is proposed for the investigation of the probe effects. A hollow graphite tube was used as a stand-in for the DSI sample probe to exert probe effects on the plasma. Laser-ablated testing elements (Fe, Zn and Mg) were introduced separately into the central channel of the plasma via the hollow graphite tube for measurement of plasma excitation temperature and electron number density. A relatively low Ar carrier gas flow rate (0.42 L min 21 ) was used to minimize perturbation to the plasma due to the gas flow. The study shows that the extent of reduction in plasma excitation temperature and electron number density increases with probe insertion position at all observation heights. In addition, the probe effects strongly depend on the relative distance of the observation position to the tip of the probe. The probe effects are the strongest near the tip of the probe and reduce at observation positions further away from the tip. Signal-to-background ratios (SBR) of the testing elements also depend strongly on the probe insertion position and the relative distance of the observation position to the tip of the probe. The SBR peaks at 5-10 mm above the tip of the sample probe. The vertical profile of SBR depends on analyte diffusion in the plasma and the plasma excitation conditions.

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Section: Effect Of Probe Insertion On Plasma Excitation Conditionsmentioning

confidence: 99%

Novel setup for investigation of the plasma conditions in direct sample insertion inductively coupled plasma atomic emission spectrometry (DSI-ICP-AES)

Cheung

Chan

2004

J. Anal. At. Spectrom.

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“…The same authors continued to look in detail at the appearance time of Zn atomic and ionic emission lines in direct insertion ICP-AES. 180 As a result of the reduction in emission background with the insertion of the sample probe, matrix effects can be severe if analyte appearance times are shifted relative to the background drop. In this study, matrix effects of NaCl on the temporal emission profiles and integrated emission intensities of Zn I and Zn II were shown to relate to the appearance time of the analyte.…”

Section: Electrothermal Vaporisationmentioning

confidence: 99%

Advances in atomic emission, absorption and fluorescence spectrometry and related techniques

Evans

Dawson²,

Fisher

et al. 2002

J. Anal. At. Spectrom.

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Estimation of background continuum emission intensity of inductively coupled plasma for correction of fast changing background

Chan

2002

Spectrochimica Acta Part B: Atomic Spectroscopy

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Effects of analyte appearance time on relative atomic and ionic emission intensities of Zn in direct sample insertion inductively coupled plasma atomic emission spectrometry

Cited by 3 publications

References 15 publications

Novel setup for investigation of the plasma conditions in direct sample insertion inductively coupled plasma atomic emission spectrometry (DSI-ICP-AES)

Novel setup for investigation of the plasma conditions in direct sample insertion inductively coupled plasma atomic emission spectrometry (DSI-ICP-AES)

Advances in atomic emission, absorption and fluorescence spectrometry and related techniques

Estimation of background continuum emission intensity of inductively coupled plasma for correction of fast changing background

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