Zone
annealing, a directional crystallization technique originally used
for the purification of semiconductors, is applied here to crystalline
polymers. Tight control over the final lamellar orientation and thickness
of semicrystalline polymers can be obtained by directionally solidifying
the material under optimal conditions. It has previously been postulated
by Lovinger and Gryte that, at steady state, the crystal growth rate
of a polymer undergoing zone annealing is equal to the velocity at
which the sample is drawn through the temperature gradient. These
researchers further implied that directional crystallization only
occurs below a critical velocity, when crystal growth rate dominates
over nucleation. Here, we perform an analysis of small-angle X-ray
scattering, differential scanning calorimetry, and cross-polarized
optical microscopy of zone-annealed poly(ethylene oxide) to examine
these conjectures. Our long period data validate the steady-state
ansatz, while an analysis of Herman’s orientation function
confirms the existence of a transitional region around a critical
velocity,
v
crit
, where there is a coexistence
of oriented and isotropic domains. Below
v
crit
, directional crystallization is achieved, while above
v
crit
, the mechanism more closely resembles that of conventional
isotropic isothermal crystallization.