Keywords:Al-doped ZnO films, Radio frequency magnetron sputtering, Ar:H 2 gas Al-doped ZnO (AZO) films were prepared by an Ar:H 2 gas radio frequency (RF) magnetron sputtering system with a AZO (2 wt·% Al 2 O 3 ) ceramic target at the low temperature of 100°C and annealed in hydrogen ambient at the temperature of 300°C. To investigate the influence of the H 2 flow ratio on the properties of the AZO films, the H 2 flow ratio was changed from 0.5% to 2%. As a result, the AZO films, deposited with a 1% H 2 addition, showed a resistivity of 11.7 × 10 -4 Ω·cm. When the AZO films were annealed at 300°C for 1 hour in a hydrogen atmosphere, the resistivity decreased from 11.7 × 10 -4 Ω·cm to 5.63 × 10 -4 Ω·cm. The lowest resistivity of 5.63 × 10 -4 Ω·cm was obtained by adding 1% hydrogen gas to the deposition and annealing process. The X-ray diffraction patterns of all the films showed a preferable growth orientation in the (002) plane. The spectrophotometer measurements showed that the transmittance of 85% was obtained by the film deposited with the H 2 flow ratio of 1% at 940 nm for GaAs/GaAlAs LEDs.