2016
DOI: 10.1007/s10854-016-5547-5
|View full text |Cite
|
Sign up to set email alerts
|

Effects of Mn doping on dielectric and ferroelectric characteristics of lead-free (K, Na, Li)NbO3 thin films grown by chemical solution deposition

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

1
2
0

Year Published

2018
2018
2024
2024

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 28 publications
1
2
0
Order By: Relevance
“…The root‐mean‐square (RMS) surface roughness obtained through Igor Pro software is also given in Figure F. Analogous to the previous reports, appropriate Mn addition, that is, 1.0 mol% in the present case, can improve the surface morphology and densification, resulting in crack‐free and uniform thin films. This behavior is closely related to two competing factors: the difference of element electronegativity and the presence of oxygen vacancies.…”
Section: Resultssupporting
confidence: 69%
“…The root‐mean‐square (RMS) surface roughness obtained through Igor Pro software is also given in Figure F. Analogous to the previous reports, appropriate Mn addition, that is, 1.0 mol% in the present case, can improve the surface morphology and densification, resulting in crack‐free and uniform thin films. This behavior is closely related to two competing factors: the difference of element electronegativity and the presence of oxygen vacancies.…”
Section: Resultssupporting
confidence: 69%
“…This is in accordance with the permittivity shown in Figure 7, where the increases in permittivity were 15.4% (Ca 2+ -doping) and 32.0% (CaTiO3-doping) at 150 °C. The values of the dielectric permittivity of the films as a function of temperature (Figure 7) are among the highest reported for KNN films from CSD 20,21,[26][27][28]30,31,33,34,36,42,46,47,51,53,54 . The dielectric loss of the three films (insets in Figure 6 and 7) showed only minor variations and were low for all three compositions.…”
Section: Discussionmentioning
confidence: 79%
“…Due to low cost and the ubiquity of Si in electronics, platinized silicon (SiPt, Pt/TiO2/SiO2/Si) is by far the most used substrate in ferroelectric oxide thin film CSD synthesis 17 . KNN thin film synthesis is no exception, and the majority of studies of KNN thin films are based on using SiPt substrates [19][20][21][22][23][24][28][29][30][31][32][33][34][35][36][40][41][42][43][46][47][48]52,53 , while a few other studies are reported using other substrates like SiO2/Si 38,58,59 , ZrO2/Si 44,45 , LaNiO3/Si 57 , Pt/MgO 39 , Pt/Al2O3 49,58 , metals 50,51,54 and SrTiO3 (STO) 18,[25][26][27]37,55,56 .…”
Section: Introductionmentioning
confidence: 99%