Gaseous Dielectrics II 1980
DOI: 10.1016/b978-0-08-025978-9.50032-9
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Effects of Particle Contamination in Sf6 Cgit Systems and Methods of Particle Control and Elimination

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Cited by 20 publications
(11 citation statements)
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“…E o is the minimum breakdown field for very large electrode area at a particular pressure, dependent only on the gas and pressure: X is a constant dependent on the gas, surface roughness and pressure; m is a constant dependent on the gas, but independent of pressure or surface roughness, being equal to 7.4 for SF 6 . Their results suggested a minimum value of E o independent of surface roughness.…”
Section: Electrode Effectsmentioning
confidence: 99%
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“…E o is the minimum breakdown field for very large electrode area at a particular pressure, dependent only on the gas and pressure: X is a constant dependent on the gas, surface roughness and pressure; m is a constant dependent on the gas, but independent of pressure or surface roughness, being equal to 7.4 for SF 6 . Their results suggested a minimum value of E o independent of surface roughness.…”
Section: Electrode Effectsmentioning
confidence: 99%
“…Usually the first breakdown value can be increased compared with spark conditioning, but the final conditioned values will be less than for the spark-conditioned system. Stress conditioning is now often used in testing practical gas-insulated systems to elevate and move conducting particle contaminants into 'particle traps' where the particles are deactivated [6] (see Section 2.1.4).…”
Section: Conditioning Effectsmentioning
confidence: 99%
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