2006
DOI: 10.1111/j.1551-2916.2006.01086.x
|View full text |Cite
|
Sign up to set email alerts
|

Effects of Stacking Scheme on Microwave Dielectric Characteristics of Ca(Mg1/3Nb2/3)O3–Ba(Zn1/3Nb2/3)O3 Layered Dielectric Resonators

Abstract: Ca(Mg1/3Nb2/3)O3 (CMN) and Ba(Zn1/3Nb2/3)O3 (BZN) ceramic disks were stacked with three stacking schemes, designated as CMN/BZN, CMN/BZN/CMN, and BZN/CMN/BZN, to yield layered dielectric resonators, and the microwave dielectric characteristics were evaluated with the TE01δ mode. Both experiments and finite element analysis showed that the microwave dielectric characteristics of the layered resonator were determined not only by the volume fraction of BZN but also by the stacking scheme. For each stacking scheme… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

0
5
0

Year Published

2008
2008
2018
2018

Publication Types

Select...
7
1

Relationship

2
6

Authors

Journals

citations
Cited by 13 publications
(5 citation statements)
references
References 18 publications
0
5
0
Order By: Relevance
“…where Q u (unloaded quality factor) could be calculated from the resonant curve by linear fractional curve fitting [12], P e,d (electric energy filling factor of the sample) was calculated by modeling the electric field distribution through finite element analysis [11], and Q c (quality factor of conducting metal walls) was obtained by the incremental frequency rule [7]. The Qf value is then calculated from the product of resonant frequency and reciprocal dielectric loss.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…where Q u (unloaded quality factor) could be calculated from the resonant curve by linear fractional curve fitting [12], P e,d (electric energy filling factor of the sample) was calculated by modeling the electric field distribution through finite element analysis [11], and Q c (quality factor of conducting metal walls) was obtained by the incremental frequency rule [7]. The Qf value is then calculated from the product of resonant frequency and reciprocal dielectric loss.…”
Section: Methodsmentioning
confidence: 99%
“…Each sample was placed on the quartz supporter, and the resonant curve for TE 01δ mode was recorded. The dielectric constant (ε r ) was calculated through an iterative process from the resonant frequency and sample size by finite element analysis [10,11], and the dielectric loss of the sample (tanδ) was obtained by…”
Section: Methodsmentioning
confidence: 99%
“…Due to the limited solid solubility, near-zero TCF values can also be achieved by the mixing of solid solutions in many complex systems, such as the Bi(Sb 1– x Ta x )O 4 system and the Bi[Sb 1– x (Nb 0.992 V 0.008 ) x ]O 4 system, in which both monoclinic BiSbO 4 type and orthorhombic stibiotantalite solid solutions can be formed. In addition to the traditional composite and solid solution methods, a layered ceramic method was frequently also used and demonstrated with ABO 3 ceramics. In our previous work, a permittivity of about 74.8, a high Q f value of above 11500 GHz, and a TCF value of about +20 ppm/°C were all obtained in the composite x Bi(Fe 1/3 Mo 2/3 )O 4 –(1– x )BiVO 4 manufactured by mixing the granulated powders (sieved through a mesh screen of 250 mm openings) of x = 0.02 and x = 0.10 samples, and this method works very well for BVO 4 solid solutions with a composition-dependent ferroelastic phase transition. The BiVO 4 prepared via a solid-state reaction method usually crystallizes in a scheelite monoclinic structure and can reversibly convert to a tetragonal structure at high temperature or high pressure.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, the Qf value and temperature coefficient of resonant frequency can be calculated by combining the contribution of each component [6]. More detailed analyzing process has been reported in the previous work [11][12][13][14][15][16].…”
Section: Finite Element Analysismentioning
confidence: 99%
“…While, as shown in this paper, the microwave dielectric properties of the layered ceramics are extrinsic and strongly dependent on the stacking scheme, resonant mode and sample size as well as the volume ratio of the end-members. Our previous work has proven that the finite element analysis can accurately predict the microwave dielectric properties of the layered ceramics [11][12][13][14][15], so the effects of the above factors are discussed theoretically by finite element analysis in this paper. Furthermore, the dependence of the microwave dielectric properties of the layered ceramics on the layer number is an interesting issue and will also be discussed in this paper.…”
Section: Introductionmentioning
confidence: 98%