The photoluminescence properties of ZnTeO and ZnSeO with dilute O concentrations are studied. The exciton bound to isolated O and its phonon replicas are observed in ZnTeO. The peak energies are hardly affected by O concentration, indicating the isoelectronic feature of O. On the other hand, the free exciton peak is shifted to lower energy in ZnSeO by increasing O concentration, even when the O concentration is as low as 0.015 %. No isoelectronic emissions are observed. We find the increase of binding energy of free exciton due to the increase of the effective mass of the conduction band edge. This can be interpreted as the modification of the band structure by the repulsive interaction between the O localized level and the conduction band of ZnSe with the scheme of band anticrossing model. [5,6]. The large band gap bowing can be interpreted as a result of the interaction between the localized energy level originating from the electronegative atoms and the energy band of the host materials. It is important to investigate the intermediate situation between doping and alloy in order to understand the interaction of these electronic states and to clarify the modification of the band structure by the localized level. The effects of localized level to the band structure of the host materials have been extensively investigated for III-V semiconductors such as N in GaP and in GaAs [7,8], while very few were reported for II-VI compounds.In this work, we studied the photoluminescence (PL) of ZnTeO and ZnSeO alloys with dilute O concentrations. We show that the influence of O on the PL properties is different in ZnTeO and ZnSeO alloys.