Effects of UV on power degradation of photovoltaic modules in combined acceleration tests

Williams, Aaron; Heta, Yushi; Doi, Takuya; Masuda, Atsushi

doi:10.7567/jjap.55.052301

Cited by 27 publications

(27 citation statements)

References 34 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The VAc units are more vulnerable to heat, oxygen, and UV light radiation, and therefore could easily form reactive radicals or unstable hydroperoxides and thereby facilitate further irreversible chemical reactions. EVA photo-degradation has been reported to cause a number of degradation modes: It has been demonstrated that UV irradiation plays a significant role in generating acetic acid in the presence of relative humidity, which can cause corrosion and power degradation of PV modules [45].…”

Section: Aging Comparison: Decomposition Products From Ftir-atrmentioning

confidence: 99%

Effect of Backsheet Properties on PV Encapsulant Degradation during Combined Accelerated Aging Tests

et al. 2020

View full text Add to dashboard Cite

Long-term photovoltaic (PV) module reliability is highly determined by the durability of the polymeric components (backsheet and encapsulation materials). This paper presents the result of experiments on encapsulant degradation influenced by the backsheet permeation properties. Towards this goal, one type of ethylene/vinyl acetate copolymer (EVA) was aged in glass/EVA/backsheet laminates in accelerated aging tests (up to 4000 h for Damp-Heat (DH) and up to 480 kWh/m2 for UV and UV-DH combined). The samples contained three backsheets with different permeation properties to examine their impact on EVA degradation. Thermal and chemical characterization shows that the EVA degradation is stronger with the glass–EVA–polyamide (PA)-based backsheet than with the polyethylene terephthalate (PET)-based backsheets. The higher oxygen transmission rate (OTR) of the PA-based backsheet may increase photo-oxidation and aggravating the degradation of EVA in the laminates. Furthermore, FTIR results were used to demonstrate the effect of damp heat exposure on the EVA interfaces, showing an accelerated degradation at the glass–EVA interface. The comparison of accelerated aging stress factors reveals that EVA suffers the strongest chemical and optical degradation when high UV, high temperature and high relative humidity are combined simultaneously.

show abstract

Section: Aging Comparison: Decomposition Products From Ftir-atrmentioning

confidence: 99%

Effect of Backsheet Properties on PV Encapsulant Degradation during Combined Accelerated Aging Tests

et al. 2020

View full text Add to dashboard Cite

show abstract

“…Pre‐exposure to light before PID testing has been shown to enhance the PID‐s effect in subsequently performed PID tests 15 . While the mechanism has not been clarified, it has been shown that exposure to UV light can lead to a subsequent increase the formation of acetic acid such as in damp heat, potentially promoting ionic conductivity 16 . On the other hand, a number of studies showed that the simultaneous application of light and system voltage results in a reduction of PID compared to the case without light for both PID‐p and PID‐s 5,17 .…”

Section: Introductionmentioning

confidence: 99%

“…15 While the mechanism has not been clarified, it has been shown that exposure to UV light can lead to a subsequent increase the formation of acetic acid such as in damp heat, potentially promoting ionic conductivity. 16 On the other hand, a number of studies showed that the simultaneous application of light and system voltage results in a reduction of PID compared to the case without light for both PID-p and PID-s. 5,17 This is attributable to annihilation of charge by the excitation of carriers from the incident high energy photons in the UV component of sunlight in the wide bandgap dielectrics used for passivating the silicon surface and also from the photoconductivity in the silicon nitride antireflective layer, reducing the electric field over the layer and the electromotive force for charge motion through it. 7 Considering the reports that PID-p can manifest in nonrepresentative dark ambient PID stress tests, it is of great importance to establish to what extent PID-p will occur in fielded modules where system voltage is accompanied by sunlight.…”

Section: Introductionmentioning

confidence: 99%

Impact of illumination and encapsulant resistivity on polarization‐type potential‐induced degradation on n‐PERT cells

Habersberger¹,

Hacke

2021

Progress in Photovoltaics

View full text Add to dashboard Cite

Power loss caused by polarization-type potential-induced degradation (PID-p) in a variety of high-performance photovoltaic cell types has been observed to be recoverable via subsequent illumination and in some cases preventable via simultaneous illumination. In this report, we describe the results of a study in which the front faces of n-PERT cells encapsulated in polymers with a broad range of electrical resistivity were exposed to varying and controlled irradiance during PID testing. For a low resistivity ethylene-vinyl acetate copolymer encapsulant, no reduction in the rate or extent of power loss was observed for irradiance as high as 1,000 W/m 2 , whereas for high and intermediate resistivity polyolefin encapsulants, 100 and 300 W/m 2 , respectively, prevented power loss. We introduce a simple model based on charge accumulation that facilitates interpretation of these results whereby degradation via charge accumulation under voltage stress and recovery due to light exposure are opposing and interdependent phenomena that describe the susceptibility of a module to power loss.

show abstract

“…We do not discuss the initial degradation and yearly degradation rates of performance in this paper. The degradation of front contact characteristics, which leads to an increase in series resistance, [11][12][13][14] and potentialinduced degradation (PID), which leads to a decrease in shunt resistance, [15][16][17] significantly affect the module lifetime. In this paper, some aspects of mechanism analyses of these degradation modes are described and the comparative experimental test results of the samples fabricated using conventional technology or our technology are also described.…”

Section: Introductionmentioning

confidence: 99%

Development of highly efficient, long-term reliable crystalline silicon solar cells and modules by low-cost mass production

Irie¹,

Tanabe²,

Atobe³

et al. 2018

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

To reduce photovoltaic (PV) power generation costs, the reduction of PV module manufacturing costs, the improvement of cell and module efficiencies, and the long-term output power warranty of PV modules are necessary. Using the high-quality, low-cost crystal growth technology, we developed a high-quality casting process by the seed-cast method. Using a seed-cast wafer, an efficiency of 20.54% has been obtained with passivated emitter and rear cells (PERCs). The ohmic contact degradation of front electrodes and potential-induced degradation are the typical modes that significantly affect the module lifetime. Considering the field stresses induced by ultraviolet light, heat and humidity (H&H), and the electrical potential difference, sequentially combined stress tests of small modules and additional stress tests of field-aged modules are performed. The test results for the modules fabricated using our technology indicated that the modules have a sufficiently long lifetime of more than 30 years and are potential-induced degradation (PID)-free under these stresses in Japanese domestic environments.

show abstract

Effects of UV on power degradation of photovoltaic modules in combined acceleration tests

Cited by 27 publications

References 34 publications

Effect of Backsheet Properties on PV Encapsulant Degradation during Combined Accelerated Aging Tests

Effect of Backsheet Properties on PV Encapsulant Degradation during Combined Accelerated Aging Tests

Impact of illumination and encapsulant resistivity on polarization‐type potential‐induced degradation on n‐PERT cells

Development of highly efficient, long-term reliable crystalline silicon solar cells and modules by low-cost mass production

Contact Info

Product

Resources

About