2010
DOI: 10.2528/pier10042012
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Efficient Time-Domain Noise Modeling Approach for Millimeter-Wave Fets

Abstract: Abstract-Based on the active coupled line concept, a novel approach for efficient noise performance modeling of millimeter-wave field-effect transistors is proposed. This distributed model considers the effect of wave propagation along the device electrodes, which can significantly affect the noise performance especially in the millimeter-wave range. By solving the multi-conductor transmission line equations, using the Finite-Difference Time-Domain technique, this procedure can accurately determine the noise c… Show more

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Cited by 10 publications
(6 citation statements)
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“…The solution is the same as the previous algorithm. By substituting Equations 11 and 12 into Equation 22, voltage and current at the beginning and the end of the line can be expressed as follows…”
Section: New Mathematical Formulation For Crlh Active Multiconductomentioning
confidence: 99%
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“…The solution is the same as the previous algorithm. By substituting Equations 11 and 12 into Equation 22, voltage and current at the beginning and the end of the line can be expressed as follows…”
Section: New Mathematical Formulation For Crlh Active Multiconductomentioning
confidence: 99%
“…Now, the obtained integro‐differential equations will be solved using the FDTD method. By using this method, the differential equations will be discretised and solved using the leap‐frog scheme …”
Section: Introductionmentioning
confidence: 99%
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“…with h 1;2 as the complex network functions from a particular source to the selected port, while the angle brackets h::i stand for the ensemble average of the randomly varying spectral amplitude [2]. For convenience unit bandwidth Df ¼ 1 Hz has been assumed here and the PSD-s are denoted as S ij ¼ l i Á l à j D E .…”
Section: Introductionmentioning
confidence: 99%
“…• Noise factor (F ) must be minimized, but to minimize the noise factor of the active device is very difficult because it is near to the lowest thanks to current manufacturing techniques [23].…”
Section: Classic Optimization Methodsmentioning
confidence: 99%