El cultivo de la uva de mesa en el Medio Vinalopó: recursos hídricos y riegos localizados de alta frecuencia

Morte, Alfredo Ramón; Amorós, Antonio M. Rico; Cantos, Jorge Olcina

doi:10.14198/ingeo1990.08.07

Cited by 2 publications

(2 citation statements)

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“…Those results showed root intrusion affected the SDI system's uniformity and yield. This was agreed with Ferguson [11], Pizarro Cabello [8], and Ayars [2].…”

Section: Spring Wheat Yield and Qualitysupporting

confidence: 91%

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Subsurface Drip Lateral Line Depths to Protect against Root Intrusion

Guo

2019

Water

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Root intrusion into emitters poses a threat to the lifespan of subsurface drip irrigation systems. In an attempt to address this problem, an experiment was conducted on spring wheat (Mengmai 30) grown in soil columns installed in a greenhouse to study the effects of lateral line depths to reduce root intrusion into emitters. The soil columns are rectangular containers, and the dimensions were 15 cm, 60 cm, 100 cm. The soil matric potential at a 20 cm depth immediately over (lateral line depth <20 cm), under (lateral line depth >20 cm), or next to (lateral line depth = 20 cm) the drip emitters was used to schedule the subsurface drip irrigation regime. Five different lateral line depths, with depths of 10, 20, 30, 40, and 50 cm, were maintained. The lateral line depths influenced the spring wheat root distribution, emitter flow rate, root intrusion, and spring wheat yield and quality. Results indicated that the shallower the lateral line depth, the more root was distributed in the surface layer. Root density values increased with soil depth. The emitter flow rate (eventual flow rate divided by the initial flow rate) increased as the lateral line depth decreased. All the treatments had root intrusion except 50 cm treatment. Root intrusion increased as the lateral line depth decreased. The lowest root intrusion rate (0%) was achieved with a lateral line depth of 50 cm. The greatest relative yield was achieved with a lateral line depth of 30 cm. After root intrusion and yield were both considered, the lateral line depth of 30–40 cm was a better choice.

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“…Those results showed root intrusion affected the SDI system's uniformity and yield. This was agreed with Ferguson [11], Pizarro Cabello [8], and Ayars [2].…”

Section: Spring Wheat Yield and Qualitysupporting

confidence: 91%

“…Rubens et al [7] measured the intrusion of coffee and citrus roots into 14 different emitter models placed in containers and found that all the tested emitters experienced root intrusion. Root intrusion is an important factor that affects SDI system uniformity and life span, as well as crop yields [2,8,9].…”

Section: Introductionmentioning

confidence: 99%