Electric and Magnetic Phenomena Studied byIn SituTransmission Electron Microscopy

Abstract

There is a wide array of technologically significant materials whose response to electric and magnetic fields can make or break their utility for specific applications. Often, these electrical and magnetic properties are determined by nanoscale features that can be most effectively understood through electron microscopy studies. Here, we present an overview of the capabilities for transmission electron microscopy for uncovering information about electric and magnetic properties of materials in the context of operational devices. When devices are operated during microscope observations, a wealth of information is available about dynamics, including metastable and transitional states. Additionally, because the imaging beam is electrically charged, it can directly capture information about the electric and magnetic fields in and around devices of interest. This is perhaps most relevant to the growing areas of nanomaterials and nanodevice research. Several specific examples are presented of materials systems that have been explored with these techniques. We also provide a view of the future directions for research.uncovering the inner workings of electronic devices in a similar way. A large part of the value of in situ investigations is the ability of an electron microscope to provide a "live" image of a device under study. In this way, any changes to the structure or properties of the device can be recorded and noted as they occur. Thus, it is straightforward to capture intermediate or metastable states of devices during operation or, sometimes more importantly, during failure. Of equal importance is the fact that electron microscopes utilize electrons as a characterization probe, which enables unique information to be ■ ■

In Situ TEM Electromechanical Testing of Nanowires and Nanotubes

“…This is important for calculating stress from the measurement of force 29. Given the dimension of nanoscale specimens, resolution is important and errors in measurement of the cross‐sectional area become more important as size decreases. Knowledge of preexisting defects, crystalline and surface quality of the specimen. In the case of electromechanical measurements, adequate resolution of the electrical variables (current and voltage). Real‐time or near real‐time observation of the experiment in order to establish cause‐effect relations, metastable states, and mechanisms of fracture or failure 30, 31 …”

“…Real‐time or near real‐time observation of the experiment in order to establish cause‐effect relations, metastable states, and mechanisms of fracture or failure 30, 31…”

Defect‐Mediated Polarization Switching in Ferroelectrics and Related Materials: From Mesoscopic Mechanisms to Atomistic Control

“…However, very limited quantitative information can be extracted from the bulk-biasing setup, since there is no control over where the new domains are formed or how the domain walls move. In contrast, some novel approaches, such as specimen holders incorporating scanning tunneling microscopy (STM) tips, [31] can enable local switching studies using field confinement by a biased scanning probe microscopy (SPM) probe.…”

Picoscale science and nanoscale engineering by electron microscopy

“…Studying the magnetic properties of nanomaterials in TEM is challenged by the presence of a magnetic field at the vicinity of the objective lens. By creating a magnetic field-free environment with the use of Lorentz lens with the scarification of magnification and possibly image resolution, the dynamic magnetic properties of a thin film can be studied by creating a local field using tiny coils built around the sample [72]. Such study can reveal the domain width as well as switching speed of the magnetic domain for exploring the limit of magnetic data storage.…”