2018
DOI: 10.1016/j.cap.2017.10.004
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Electrical and optical characterization of SiOxNy and SiO2 dielectric layers and rear surface passivation by using SiO2/SiOxNy stack layers with screen printed local Al-BSF for c-Si solar cells

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Cited by 11 publications
(3 citation statements)
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“…Among them, PECVD and LPCVD are the most commonly employed methods. Additionally, PECVD can be extended to radio frequency PECVD (RF-PECVD) [69], electron cyclotron resonance PECVD (ECR-PECVD) [70,71], and inductively coupled PECVD (IC-PECVD) [72].…”
Section: Preparation Of Sinxoy Filmmentioning
confidence: 99%
“…Among them, PECVD and LPCVD are the most commonly employed methods. Additionally, PECVD can be extended to radio frequency PECVD (RF-PECVD) [69], electron cyclotron resonance PECVD (ECR-PECVD) [70,71], and inductively coupled PECVD (IC-PECVD) [72].…”
Section: Preparation Of Sinxoy Filmmentioning
confidence: 99%
“…1 PERC solar cell contains 85-100 nm thin passivation layer of a dielectric material such as SiN x , SiO 2 , SiO x N y , or Al 2 O 3 on the rear side. 2 In order to create electrical contacts with the silicon wafer, narrow openings are created by selectively removing the passivation layer. Various techniques such as photolithography, 3 chemical etching, 4 and laser ablation 5 have been reported in the literature to create narrow openings.…”
Section: Introductionmentioning
confidence: 99%
“…The sun provides a continuous energy supply more than human beings needed for various purposes so the production of energy using solar cells is a precise aspect of green and clean energy production. [ 1–3 ]…”
Section: Introductionmentioning
confidence: 99%