Electrical Breakdown in Thin Dielectric Films

Forlani, F.; Minnaja, N.

doi:10.1116/1.1315671

Cited by 82 publications

(18 citation statements)

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Although the data rather exhibit a dependency of -0.4 than of -0.5 this small difference cannot be considered as significant, because 2 or 3 data points within the given error bars are not sufficient to decide between both trends. However, in our previous measurements [8] the breakdown strengths of AO-R0 are displayed in the range of 0.07 -1.5 mm fitting a slope of -0.5 which is consistent with [6,7,46] for alumina.…”

Section: Weibull Analysis and Thickness-dependencesupporting

confidence: 85%

Thickness-dependence of the breakdown strength: Analysis of the dielectric and mechanical failure

Neusel

Jelitto

Schmidt

et al. 2015

Journal of the European Ceramic Society

View full text Add to dashboard Cite

The breakdown strength as well as the mechanical strength of ceramic materials decreases with increasing volume. The volume-effect of the mechanical strength can be explained by the Weibull theory. For the breakdown strength the same explanation has been often assumed.In order to validate this assumption breakdown strength and mechanical strength of alumina samples with defined porosities were compared. Differences in the Weibull moduli of breakdown and mechanical strength distributions indicate that the volume-effect cannot explain the thickness-dependence of the breakdown strength. In particular, the thicknessdependence of the breakdown strength always leads to a Weibull modulus of two which is not 2 in agreement with the measured Weibull moduli for samples with constant thickness. It can be concluded that the thickness-dependence of the breakdown strength cannot be explained by the Weibull concept. A recently developed breakdown model which is based on space charge injection is able to explain the experimental results.

show abstract

Section: Weibull Analysis and Thickness-dependencesupporting

confidence: 85%

Thickness-dependence of the breakdown strength: Analysis of the dielectric and mechanical failure

Neusel

Jelitto

Schmidt

et al. 2015

Journal of the European Ceramic Society

View full text Add to dashboard Cite

show abstract

“…where E b is the breakdown field, γ is the material-dependent constant, d is the thickness of the dielectric, and ξ is a coefficient that is justified by the mechanism of electric breakdown [34], [36]. In accordance with (1), the breakdown field for solid dielectrics is decreasing according to a power law with increasing thickness.…”

Section: Resultsmentioning

confidence: 90%

“…3 using various functions. There have been extensive studies of electric breakdown in solid dielectrics under ambient conditions [31]- [36]. One of the results of these studies is the thickness-dependent dielectric breakdown law, experimentally proved for a variety of dielectric materials investigated at ambient conditions [31]- [36] …”

Section: Resultsmentioning

confidence: 99%

High Voltage Generation With Transversely Shock-Compressed Ferroelectrics: Breakdown Field on Thickness Dependence

Shkuratov

Baird

Antipov

et al. 2016

IEEE Trans. Plasma Sci.

View full text Add to dashboard Cite

The ability of ferroelectric materials to generate high voltage under shock compression is a fundamental physical effect that makes it possible to create miniature autonomous explosive-driven pulsed power systems. Shock-induced depolarization releases an electric charge at the electrodes of the ferroelectric element, and a high electric potential and a high electric field appear across the element. We performed systematic studies of the electric breakdown field, E b (d), as a function of the ferroelectric element thickness, d, for Pb(Zr 0.95 Ti 0.05 )O 3 (PZT 95/5) and Pb(Zr 0.52 Ti 0.48 )O 3 (PZT 52/48) ceramics compressed by transverse shock waves (shock front propagates perpendicular to the polarization vector) and established a relationship between these two values: E b (d) = const · d −ξ . This law was found to be true in a wide range of ferroelectric element thicknesses from 1 to 50 mm. This result makes it possible to predict ferroelectric generator (FEG) output voltages up to 500 kV and it forms the basis for the design of ultrahigh-voltage FEG systems. Index Terms-Electric breakdown, explosive pulsed power, ferroelectric generators (FEGs).

show abstract

“…Furthermore, it is very doubtful whether d -1/4 can be used in the range of very small thicknesses as was done by Nicol. [5] and [6] are combined, the total n u m b e r of holes created per second is ji/e 9 (exp(ad) --1) :-j~/e 9 (exp (~od e x p ( --F J F ) ) --1) To make the current j larger than the injected current ji, eFd/Vo must be much larger (7,8) has d r a w n attention to the influence of the positive charges that are left behind by the knocked-off electrons.…”

Section: Discussionmentioning

confidence: 99%

“…When a breakdown occurs, the oxide layer melts in places (Fig. The results are first compared with those obtained by other workers (1)(2)(3)(4) and then with theories on the avalanche breakdown of AI20~ (4)(5)(6)(7)(8). la).…”

mentioning

confidence: 87%

The Dielectric Breakdown of Anodic Aluminum Oxide

Wit

Wijenberg

Crevecoeur

1976

J. Electrochem. Soc.

View full text Add to dashboard Cite

Nonshorting breakdowns of anodic alumina films, 200-2500A thick, have been measured. These measurements reveal the existence of a thicknessindependent breakdown field which is close to the anodizing field. The existing theories, which make use of electron avalanching, cannot explain these facts and it is suggested that the breakdown is initiated by ionic movement and that it is related to the anodizing process.

show abstract

Electrical Breakdown in Thin Dielectric Films

Cited by 82 publications

References 0 publications

Thickness-dependence of the breakdown strength: Analysis of the dielectric and mechanical failure

Thickness-dependence of the breakdown strength: Analysis of the dielectric and mechanical failure

High Voltage Generation With Transversely Shock-Compressed Ferroelectrics: Breakdown Field on Thickness Dependence

The Dielectric Breakdown of Anodic Aluminum Oxide

Contact Info

Product

Resources

About