2005
DOI: 10.1016/j.sna.2005.04.022
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Electrochemical deposition of Cu and Ni/Cu multilayers in Si Microsystem Technologies

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Cited by 22 publications
(12 citation statements)
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“…Also, thin Ni/Cu multilayer film is technologically interesting system that attracted great attention owing to high mechanical strength, high wear and corosion resistance and giant magnetoresistance behaviour [7][8][9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…Also, thin Ni/Cu multilayer film is technologically interesting system that attracted great attention owing to high mechanical strength, high wear and corosion resistance and giant magnetoresistance behaviour [7][8][9][10][11].…”
Section: Introductionmentioning
confidence: 99%
“…In recent years, more metals have been investigated for MEMS due to their excellent electrical and thermal conductivity and mechanical and magnetic properties [1][2][3][4][5][6]. However, up to now metallic MEMS components that have been fabricated are mainly nickel and copper with simple structures since the main micromachining technology is based on LIGA (an acronym from German words for lithography, electroforming, and molding) [7,8] that can be applied to fabricate high-aspect-ratio bulk microstructure for Ni and Cu [9,10].…”
Section: Introductionmentioning
confidence: 99%
“…EC deposition of Cu has already been proposed for the development of advanced inductive devices and microsystems [13,14]. In principle, Cu is well suited for microsystem applications in Si technology, owing to its low resistivity, low cost and ease to grow electrochemically in a well-controlled way.…”
Section: Introductionmentioning
confidence: 99%