2017 40th International Spring Seminar on Electronics Technology (ISSE) 2017
DOI: 10.1109/isse.2017.8000933
|View full text |Cite
|
Sign up to set email alerts
|

Electrochemical migration investigations on Sn-Sb solder alloys using 3.5 wt% NaCl solution

Abstract: ECM (electrochemical migration)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 18 publications
0
1
0
Order By: Relevance
“…Only a precipitate is formed. However, when the concentration is increased beyond a certain point, dendritic growth occurs again with increasing risk of a short circuit [14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…Only a precipitate is formed. However, when the concentration is increased beyond a certain point, dendritic growth occurs again with increasing risk of a short circuit [14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%