2014
DOI: 10.1007/s11664-014-3400-2
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Electromigration Behaviors and Effects of Addition Elements on the Formation of a Bi-rich Layer in Sn58Bi-Based Solders

Abstract: This study investigates the electromigration (EM) behaviors and effects of the addition elements on the formation of a Bi-rich layer in Sn58Bi-based solders including Sn58Bi (SB), Sn58Bi0.5Ag (SBA) and Sn58Bi0.5Ag0.1Cu0.07-Ni0.01Ge (SBACNG) solders. The EM tests were conducted at a relatively high temperature of 373 K and at a current density of 30 kA/cm 2 . Although the dominant diffusing atom was Bi, hillocks were formed from Sn more easily than from Bi. The electrical resistance increased in the solder duri… Show more

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Cited by 27 publications
(2 citation statements)
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“…The coarsening of the microstructure in the solder joint can be attributed to two main factors. In the eutectic solder system of Sn–58Bi, the driving force for Bi coarsening is the reduction of specific interfacial energy at grain boundaries or Sn–Bi interfaces [ 30 ]. At lower current densities, the growth mechanism of the Bi phase is primarily controlled by dislocations.…”
Section: Defects Induced By Electromigration Of Snbi Alloy On Cu Matrixmentioning
confidence: 99%
“…The coarsening of the microstructure in the solder joint can be attributed to two main factors. In the eutectic solder system of Sn–58Bi, the driving force for Bi coarsening is the reduction of specific interfacial energy at grain boundaries or Sn–Bi interfaces [ 30 ]. At lower current densities, the growth mechanism of the Bi phase is primarily controlled by dislocations.…”
Section: Defects Induced By Electromigration Of Snbi Alloy On Cu Matrixmentioning
confidence: 99%
“…Ag, Al, Co, Ga, Ge, In, Ni, Sb, Ti, Zn into a solder is a useful technique to improve the physical properties of the solder. Although these elements could improve certain properties of the solder, they could undesirably alter some properties of the alloy, and different alloying elements react variedly to different solder alloys [10][11][12][13][14][15][16][17][18][19][20][21].…”
Section: Contents Lists Available At Sciencedirectmentioning
confidence: 99%