1987
DOI: 10.1002/ctpp.19870270402
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Electron Attachment and Detachment Processes in Electronegative Gases

Abstract: Selected results of recent studies on electron attachment (especially to excited molecules) and detachment processes in electronegative gases are presented and discussed and their relevance to modern technologies is indicated.

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Cited by 38 publications
(4 citation statements)
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“…It has to be stressed that the normalization procedure (35) can only be carried out in a reliable way if the anion yield function is obtained at sufficiently narrow electron energy width and down to sufficiently low energies. We also emphasize that the gas temperature is an important parameter since attachment cross-sections may depend very strongly on the rovibrational distribution of the molecules (O'Malley, 1967;Chantry, 1969;Massey, 1976;Christophorou, 1987;Smith and Sˇpanel, 1994;Hahndorf and Illenberger, 1997).…”
Section: Measurement Of Cross-sections For Electron Attachmentmentioning
confidence: 99%
“…It has to be stressed that the normalization procedure (35) can only be carried out in a reliable way if the anion yield function is obtained at sufficiently narrow electron energy width and down to sufficiently low energies. We also emphasize that the gas temperature is an important parameter since attachment cross-sections may depend very strongly on the rovibrational distribution of the molecules (O'Malley, 1967;Chantry, 1969;Massey, 1976;Christophorou, 1987;Smith and Sˇpanel, 1994;Hahndorf and Illenberger, 1997).…”
Section: Measurement Of Cross-sections For Electron Attachmentmentioning
confidence: 99%
“…By using the measured EEDF, the positive ion flux data and the available cross-section data in [51][52][53][54][55][56][57][58], we estimate the number density of F − for a set of operating conditions. The production kinetics of F − may be approximated by the following equation.…”
Section: F − Number Densitymentioning
confidence: 99%
“…Alpha particles emitted by the Polonium ionize the N2 carrier gas creating secondary electrons that are rapidly thermalized. SF6 rapidly attaches low energy electrons to form SF6-, SF•-, and F- [Christophorou, 1987], all of which react with SiF4 at the collision rate to form SiFt- [Huey and Lovejoy, 1996]. The residence time in the ion source (-30 ms) is sufficient so that the ion-molecule chemistry is driven to completion which insures that SiFt-is by far the dominant ion produced with a mass of <200 amu.…”
Section: Ion Sourcementioning
confidence: 99%