2013
DOI: 10.1063/1.4827680
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Electron density profile measurements at a self-focusing ion beam with high current density and low energy extracted through concave electrodes

Abstract: The self-focusing phenomenon has been observed in a high current density and low energy ion beam. In order to study the mechanism of this phenomenon, a special designed double probe to measure the electron density and temperature is installed into the chamber where the high current density ion beam is injected. Electron density profile is successfully measured without the influence of the ion beam components. Estimated electron temperature and density are ∼0.9 eV and ∼8 × 108 cm−3 at the center of ion beam cro… Show more

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Cited by 5 publications
(6 citation statements)
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“…The experimental apparatus (figure 1) includes an ion source, extracting electrodes, an ion-beam propagation chamber, and measurement systems including a pair of double probes and three Faraday cups. The setup is almost the same as that used in our previous experimental work [4][5][6][7][8].…”
Section: Experimental Methodsmentioning
confidence: 99%
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“…The experimental apparatus (figure 1) includes an ion source, extracting electrodes, an ion-beam propagation chamber, and measurement systems including a pair of double probes and three Faraday cups. The setup is almost the same as that used in our previous experimental work [4][5][6][7][8].…”
Section: Experimental Methodsmentioning
confidence: 99%
“…A transition from a rather broad profile to a focused profile takes place when the beam energy exceeds a threshold, which is dependent of I ib . For example, a rapid transition takes place between 60 and 80 eV for I ib ∼30 mA [6] and an abrupt transition between 140 and 160 eV for I ib ∼100 mA [4,5]. Electrostatic double probes were installed in a beam plasma region and, with I ib =30 mA, profiles of the electron density (n e ) and temperature (T e ) were measured [6].…”
Section: Introductionmentioning
confidence: 99%
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“…An example of the use of movable emissive probes is reported by Sherman and Allison [152]. More recently in low-energy positive beams, movable 4-pin double probes are used [153]¸the probe support is a conductor to avoid charge-up of the internal insulator up to the beam potential. Voltage oscillations were measured using capacitive probes [154] or arrays of Langmuir probes suitably located to detect also the frequency-wavenumber spectrum [62]: diagnostic systems of this kind allowed the identification of the features of the waves excited during beam-gas interaction.…”
Section: Measurement Of Beam Space Charge Compensation or Beam Plasmamentioning
confidence: 99%