Our TiO 2 thin films were elaborated using spray pyrolysis technique. The spray solutions were prepared by two titanium precursors: titanium (IV) propoxide and titanium chloride. The elaborated thin films were analyzed with different characterization techniques such as X-ray diffraction (XRD), Raman spectroscopy, scanning electron microscopy (SEM), and UV-visible spectroscopy.These characterizations showed that the change of precursors from titanium chloride to titanium propoxide has a significant impact on all TiO 2 properties.The structural characterizations showed the formation of anatase TiO 2 and the crystallization improvement when the precursor changed from titanium chloride to titanium (IV) propoxide, which proves the superiority of our TiO 2 thin layers made without any type of annealing in comparison with other previous studies. The SEM images showed an improvement of the surface quality of the TiO 2 thin layers with the change of TiO 2 precursors' solution. The obtained optical properties confirmed the semiconducting properties of TiO 2 prepared by titanium propoxide with a large band gap equal to 3.28 eV and shifted to 3.18 eV. The refractive index increases from $1.75 to $2.14, while the porosity decreases. To confirm the experimental results, the Wien2K code, founded on the full-potential linearized augmented plane wave (FP-LAPW), has been used. The theoretical study has been done by applying the generalized gradient approximation (GGA), the modified Beck-Johnson (MBJ) exchange potential, and the local spin density approximation + Hubbard's parameter U (LSDA + U). The theoretical results varied with the variation of approximations. The obtained properties were improved with LSDA + U and acquired the real values of Eg, n, and k for anatase TiO 2 (like Eg = 3.214 eV). The obtained experimental and theoretical results could be considered superposable or better than other ones recently published.