The complex dielectric functions of single crystals of Gd 5 Si 2 Ge 2 were obtained using spectroscopic ellipsometry ͑SE͒ in the photon energy range of 1.5-5.0 eV at room temperature. Reflectance difference ͑RD͒ spectra for the a-b and b-c planes of single crystals of Gd 5 Si 2 Ge 2 were derived from these dielectric functions and compared to those obtained from reflectance difference spectroscopy ͑RDS͒ at near-normal incidence. The two experimental RD spectra from SE and RDS agreed well. The in-plane optical anisotropy of the sample is mainly due to intrinsic bulk properties because of its larger magnitude ͑4 ϫ 10 −2 ͒ compared to surface-induced optical anisotropies, with a magnitude of only about 10 −3 for a typical cubic material.