Embedded Loopback Test for RF ICs

(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems

“…Loop-back test and diagnosis of transceivers have also been widely explored [32][33][34][35][36]. They follow the general scheme depicted in Figure 5.…”

“…This concept leads to DFT implementations, although it relies on removing and switching some components, increasing complexity and disturbing the normal system operation. Furthermore, an on-chip implementation is not so simple since, in practice, some components need to be removed for testing [36] (namely the band-pass filter, close to the antenna, and the power amplifier in the transmission path), or a signal attenuator has to be introduced in the loopback connection to accomodate the PA output signal to the LNA input signal range [34].…”

“…The use of test sensors embedded into the RF system has also been proposed [34][35][36][37][38][39][40][41]. A number of sensors are usually located along the RF signal path, as it is depicted in Figure 6.…”

Built-in Loopback Test for IC RF Transceivers

“…Circuit implementations of TAs with the input 20 dBm have been reported [26], [30], [37]. The TA circuit can be disabled in the normal operation mode in order not to affect the chip performance.…”

CMOS blocks for on-chip RF test

“…A representative example of setting-up an RF test is the loopback architecture, where only one element (block) added on chip, to close the loop, might be sufficient in some cases [3][4][5][6][7]. Although all blocks involved in the loop are under test, only indirect access to a given block is provided.…”