1966
DOI: 10.1021/ac60238a008
|View full text |Cite
|
Sign up to set email alerts
|

Energy Dispersion for Quantitative X-Ray Spectrochemical Analysis.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

1967
1967
2014
2014

Publication Types

Select...
4
3

Relationship

0
7

Authors

Journals

citations
Cited by 16 publications
(2 citation statements)
references
References 13 publications
0
2
0
Order By: Relevance
“…The term “ Energy-Dispersive XRF ” has its origin probably in the mid-1950s with the advent of (vacuum-tube-based) multichannel analyzers in combination with gas-filled proportional counters; in 1954 an 8-channel “X-ray Quantometer” was presented at Pittcon (Kemp and Andermann, 1956; Kemp et al , 1955; Lüscher, 1955). Applications by employing a 400 channel MCA and gas proportional counters were described by Birks and Batt (1963) showing Fe–Cr–Ni spectra with a resolution of around 1200 eV; an improved version (but with same energy resolution, Figure 4) for excitation by secondary targets followed 3 years later (Birks et al , 1966). Even for the difficulties with the deconvolution of overlapping peaks arising from the relatively poor energy resolution the technology was seen as advantageous in terms of speed and higher sample throughput.…”
Section: Semiconductor Detectors and Related Devicesmentioning
confidence: 99%
“…The term “ Energy-Dispersive XRF ” has its origin probably in the mid-1950s with the advent of (vacuum-tube-based) multichannel analyzers in combination with gas-filled proportional counters; in 1954 an 8-channel “X-ray Quantometer” was presented at Pittcon (Kemp and Andermann, 1956; Kemp et al , 1955; Lüscher, 1955). Applications by employing a 400 channel MCA and gas proportional counters were described by Birks and Batt (1963) showing Fe–Cr–Ni spectra with a resolution of around 1200 eV; an improved version (but with same energy resolution, Figure 4) for excitation by secondary targets followed 3 years later (Birks et al , 1966). Even for the difficulties with the deconvolution of overlapping peaks arising from the relatively poor energy resolution the technology was seen as advantageous in terms of speed and higher sample throughput.…”
Section: Semiconductor Detectors and Related Devicesmentioning
confidence: 99%
“…New techniques being investigated are the direct electron excitation of samples (405, 501, 538), a portable x-ray instrument using radio-isotope sources (266), and the use of energy dispersion rather then wavelength dispersion for the determination of major constituents in stainless steels (43).…”
Section: Matrix and Interelement Effects Inmentioning
confidence: 99%