Abstract:Role of dual-laser ablation in controlling the Pb depletion in epitaxial growth of Pb(Zr0.52Ti0.48)O3 thin films with enhanced surface quality and ferroelectric properties Effect of oxygen stoichiometry on the ferroelectric property of epitaxial all-oxide La 0.7 Sr 0.3 MnO 3 /Pb(Zr 0.52 Ti 0.48 )O 3 /La 0.7 Sr 0.3 MnO 3 thin-film capacitors
“…Obviously, the intensity of interfacial Al−O columns is higher than that of other Al−O columns, implying that the interface diffusion may occur between Al and Ni/Mn. The out-of-plane lattice parameters in the interface area have been investigated by geometrical lattice mapping directly on the high-resolution HAADF image using a 2D Gaussian fitting approach 50,51 . Figure 3c displays a plot of the out-of-plane lattice spacing against the distance, which provides evidence for the difference in the out-of-plane lattice parameters between LNMO and LAO across the interface.Figure 3( a ) Atomic-resolution HAADF image of the LNMO/LAO interface, viewed along the [010] p LAO zone axis.…”
The magnetic and electrical properties of complex oxide thin films are closely related to the phase stability and cation ordering, which demands that we understand the process-structure-property relationships microscopically in functional materials research. Here we study multiferroic thin films of double-perovskite La2NiMnO6 epitaxially grown on SrTiO3, KTaO3, LaAlO3 and DyScO3 substrates by pulsed laser deposition. The effect of epitaxial strains imposed by the substrate on the microstructural properties of La2NiMnO6 has been systematically investigated by means of advanced electron microscopy. It is found that La2NiMnO6 films under tensile strain exhibit a monoclinic structure, while under compressive strain the crystal structure of La2NiMnO6 films is rhombohedral. In addition, by optimizing the film deposition conditions a long-range ordering of B-site cations in La2NiMnO6 films has been obtained in both monoclinic and rhombohedral phases. Our results not only provide a strategy for tailoring phase stability by strain engineering, but also shed light on tuning B-site ordering by controlling film growth temperature in double-perovskite La2NiMnO6 films.
“…Obviously, the intensity of interfacial Al−O columns is higher than that of other Al−O columns, implying that the interface diffusion may occur between Al and Ni/Mn. The out-of-plane lattice parameters in the interface area have been investigated by geometrical lattice mapping directly on the high-resolution HAADF image using a 2D Gaussian fitting approach 50,51 . Figure 3c displays a plot of the out-of-plane lattice spacing against the distance, which provides evidence for the difference in the out-of-plane lattice parameters between LNMO and LAO across the interface.Figure 3( a ) Atomic-resolution HAADF image of the LNMO/LAO interface, viewed along the [010] p LAO zone axis.…”
The magnetic and electrical properties of complex oxide thin films are closely related to the phase stability and cation ordering, which demands that we understand the process-structure-property relationships microscopically in functional materials research. Here we study multiferroic thin films of double-perovskite La2NiMnO6 epitaxially grown on SrTiO3, KTaO3, LaAlO3 and DyScO3 substrates by pulsed laser deposition. The effect of epitaxial strains imposed by the substrate on the microstructural properties of La2NiMnO6 has been systematically investigated by means of advanced electron microscopy. It is found that La2NiMnO6 films under tensile strain exhibit a monoclinic structure, while under compressive strain the crystal structure of La2NiMnO6 films is rhombohedral. In addition, by optimizing the film deposition conditions a long-range ordering of B-site cations in La2NiMnO6 films has been obtained in both monoclinic and rhombohedral phases. Our results not only provide a strategy for tailoring phase stability by strain engineering, but also shed light on tuning B-site ordering by controlling film growth temperature in double-perovskite La2NiMnO6 films.
“…The crystal structural quality and growth behavior of the films can be understood with the knowledge of atomic details of the interface structure between the films and the substrates. Jin et al reported that the La 0.3 Sr 0.7 MnO 3 (LSMO) hillocks on Nb doped SrTiO 3 (STO) substrates could induce regular 180° domains in subsequently deposited PTO films 14,20 . A close investigation showed that interdiffusion across the LSMO/Nb‐STO interface leads to distinct structural and physical properties in the PTO/LSMO/Nb‐STO system.…”
Section: Introductionmentioning
confidence: 99%
“…The atomically controlled interface in epitaxial heterostructures, such as multilayers, 8 superlattices, [9][10][11] and ultrathin films, 12,13 play a prominent role in determining the microstructure evolution [14][15][16][17] and functionalities of the films. [18][19][20][21] The crystal structural quality and growth behavior of the films can be understood with the knowledge of atomic details of the interface structure between the films and the substrates.…”
Section: Introductionmentioning
confidence: 99%
“…Jin et al reported that the La 0.3 Sr 0.7 MnO 3 (LSMO) hillocks on Nb doped SrTiO 3 (STO) substrates could induce regular 180 • domains in subsequently deposited PTO films. 14,20 A close investigation showed that interdiffusion across the LSMO/Nb-STO interface leads to distinct structural and physical properties in the PTO/LSMO/Nb-STO system. The polarization direction and strength were also reported to be influenced by chemical adsorbates and electronic processes occurring at the PTO/SrRuO 3 epitaxial interface and at the surface.…”
Lattice strain has been used to modify the properties of ferroelectric oxide films. Introducing strain in thin film is usually realized based on the lattice mismatch of the heterostructural materials, which form multilayered systems or composite structure. For the composite structure of PbTiO3/α‐PbO‐type (PTO/PO‐T) structure phase, the PO‐T structure phase plays the key role in introducing a high strain in the PTO phase and resulting in a giant polarization of the PTO phase. Here, we perform a detailed study on the PO‐T structure phase on atomic scale by means of high‐resolution (scanning) transmission electron microscopy. The atomic details, including cations and oxygen of the PO‐T structure phase, are revealed, which show the α‐PbO structure with parts of the Pb atoms being substituted by Ti atoms. Local inhomogeneity in Ti atom distribution is found in nanometer scale. Experimental investigations show that the PO‐T structure phase is formed on a layer of the PTO phase with a thickness of one or two unit cells, which grows covering the underneath La0.3Sr0.7MnO3 (LSMO) electrode layer. The formation mechanism of the PO‐T structure phase is discussed on the basis of the atomic details of the PO‐T/PTO/LSMO interfaces and the growth condition of the film.
“…In nanostructured PTO/LSMO similar to the present study, the thickness of the LSMO layer determines the location of 180 domain walls. 19 Internal bias can couple with charge ordering at the PTO/LSMO interface. 20 Here, we employ photoemission electron microscopy using soft x-rays (X-PEEM) to study the ferroelectric imprint and Mn valency at the PTO/nanostructured LSMO buried interface in a spatially resolved manner.…”
We employed a multitechnique approach using piezo-force response microscopy and photoemission microscopy to investigate a self-organizing polarization domain pattern in PbTiO3/La0.7Sr0.3MnO3 (PTO/LSMO) nanostructures. The polarization is correlated with the nanostructure morphology as well as with the thickness and Mn valence of the LSMO template layer. On the LSMO dots, the PTO is upwards polarized, whereas outside the nanodots, the polarization appears both strain and interface roughness dependent. The results suggest that the electronic structure and strain of the PTO/LSMO interface contribute to determining the internal bias of the ferroelectric layer.
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