2006
DOI: 10.1109/lpt.2006.875322
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Enhanced carrier confinement in AlInGaN-InGaN quantum wells in near ultraviolet light-emitting diodes

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Cited by 29 publications
(5 citation statements)
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“…Another challenge in exploring phosphors for pc-WLEDs is to reduce the energy gap between the 4f level and the lowest 5d level to below 3.1 eV (400 nm) to match the emission of InGaN LED chips . This energy gap requirement demands for scientists to explore new oxide host crystals with shorter activator–anion bond lengths and high polyhedral distortion .…”
Section: Introductionmentioning
confidence: 99%
“…Another challenge in exploring phosphors for pc-WLEDs is to reduce the energy gap between the 4f level and the lowest 5d level to below 3.1 eV (400 nm) to match the emission of InGaN LED chips . This energy gap requirement demands for scientists to explore new oxide host crystals with shorter activator–anion bond lengths and high polyhedral distortion .…”
Section: Introductionmentioning
confidence: 99%
“…[6][7][8] The various modification meth-ods on quantum well structures, such as the polarizationmatched AlGaInN or InGaN barriers, have demonstrated that polarization effects can be effectively eliminated and the radiative recombination rate is improved. [9][10][11][12] However, it is difficult to grow AlInGaN layers with high crystalline quality due to the differences between optimal incorporation conditions for growth of AlN and InN. Also, the crystalline quality of active layers could be worse as more InGaN barriers and wells are deposited repeatedly due to the accumulation of large compressive strain.…”
mentioning
confidence: 99%
“…8b. Earlier works 58,59 have reported that thinner channel layer tends to have narrower potential well and lowering the thickness causes the energy levels in the quantum states to be filled up completely. Therefore, electrons will be forced out in to the buffer regardless of back barrier effect.…”
Section: Optimization and Scaling Of Channel Layer Thicknessmentioning
confidence: 99%