Enhanced Nucleation of Secondary Defects on Slip Planes in Copper by Electron Irradiation

Sumida, Naoto; Takemoto, Katsuhiro; Mori, Hirotarô; Fujita, Hiroshi

doi:10.1143/jjap.14.295

Jpn. J. Appl. Phys.

1975

DOI: 10.1143/jjap.14.295

|View full text |Cite

Enhanced Nucleation of Secondary Defects on Slip Planes in Copper by Electron Irradiation

Naoto Sumida¹,

Katsuhiro Takemoto²,

Hirotarô Mori³

et al.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

Supporting

Mentioning

Contrasting

Year Published

1978

Publication Types

Select...

Article1

Relationship

Self Cite0

Independent1

Authors

Journals

Cited by 1 publication

References 0 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

In Situ Deformation by High Voltage Electron Microscopy

Fujita¹

1978

Proc. annu. meet. Electron Microsc. Soc. Am.

View full text Add to dashboard Cite

It is well known that materials are structure-sensitive. This means that properties of materials, especially mechanical properties, are determined by behavior of the lattice imperfections such as dislocations and point defects. High resolution and quick recording of the images by electron microscopy have been effectively used for studying behavior of lattice imperfections. It is very difficult, however, to get a definite conclusion about the deformation processes based on the static electron microscope observation of the dislocation structures formed by deformation, because many processes can be considered to get the same dislocation structure. Therefore, dynamic study of the behavior of lattice imperfections is necessary to carry out in order to investigate the properties of materials.

show abstract

In Situ Deformation by High Voltage Electron Microscopy

Fujita¹

1978

Proc. annu. meet. Electron Microsc. Soc. Am.

View full text Add to dashboard Cite

show abstract

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Enhanced Nucleation of Secondary Defects on Slip Planes in Copper by Electron Irradiation

Cited by 1 publication

References 0 publications

In Situ Deformation by High Voltage Electron Microscopy

In Situ Deformation by High Voltage Electron Microscopy

Contact Info

Product

Resources

About