2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2015
DOI: 10.1109/dft.2015.7315147
|View full text |Cite
|
Sign up to set email alerts
|

Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

Abstract: This paper proposes a scalable solution for obstructing and detecting malicious activity as well as erroneous events during mission mode operation of untrusted memories. The approach obfuscates data written into a memory and remaps the location of memory contents in a manner difficult for an attacker to predict, making it harder for a Hardware Trojan to be deterministically triggered or controlled by malicious agents. Simultaneously, the approach aids in the detection of soft errors. To our knowledge, this app… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2018
2018
2022
2022

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
references
References 20 publications
0
0
0
Order By: Relevance