Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios

Lee, Taehee; Touba, N.A.; Yang, Joon-Sung

doi:10.1109/tcad.2017.2681063

Cited by 6 publications

(6 citation statements)

References 20 publications

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“…Thus, the total count bits is minimized with the help of these optimal orders of test vectors. The results obtained from the proposed approach are compared with other recent test data compression approaches and for validating the performance of the proposed approach [4,9].…”

Section: Experimental Results and Analysismentioning

confidence: 99%

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On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

et al. 2021

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In this manuscript, a novel test data compression (TDC) system is proposes for reducing a test data volume (TDV) for circular scan (CS) architecture. A modified version of meta-heuristic population based optimization approach, hence it is called shuffled shepherd optimization (SSO) and it is used to optimize the conflicting bit minimization (CBM) problem. In CS framework, TDC is reached by upgrading only the conflicting bits among template pattern, real test pattern. Reduced test data volume and test application time are achieved by diminishing the Hamming distance between the currently captured response and the subsequent test vector. The CBM issue is formulated by a traveling salesman problem (TSP). Here, the test vectors are assumed by cities, the HD among test vectors a pair is assumed by distance of interurban. A modified version of the SSO algorithm called as MSSO is applied in combination using mutation operator for solving the issue of CBM. Experimental outcomes display the proposed TDC method using MSSO achieves an average development of 8.36% in compression ratio (CR) as well as 6.77% in TAT is attained by reducing a TDV. This proposed approach outperforms other state-of-art test data compression schemes by providing improved CR, TAT reduction and TDV reduction.

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Section: Experimental Results and Analysismentioning

confidence: 99%

“…So, several test compaction methods [14] possess the capability to control the test data volume in a great extent. Then, the compressed experimental sets might attain less detection of non-modeled physical faults [9,21]. The BIST is widely used for memory testing and is not logical BIST requires more test time [7].…”

Section: Introductionmentioning

confidence: 99%

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

et al. 2021

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“…But, this architecture suffers from the area overhead and routing congestion. The various broadcast-based scan compression architectures have been proposed in [5,15,[17][18][19][20][21][22][28][29][30][31][32][33][34][35][36].…”

Section: Broadcast-based Scan Compression Architecturementioning

confidence: 99%

“…Increased scan compression increases the expansion ratio in the decompressor to internal scan chains. This increased compression ratio reduces controllability and observability in the scan chains [1], increasing patterns required to detect the faults in the CUT. Increased targeted compression ratio increases free variable dependencies and causes loss of test coverage, patterns inflation, and TAT.…”

Section: Introductionmentioning

confidence: 99%

New scan compression approach to reduce the test data volume

Shantagiri

Kapur

Shastry

2021

IET Computers & Digital Tech

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The test data volume (TDV) increases with increased target compression in scan compression and adds to the test cost. Increased TDV is the result of a dependency across scan flip‐flops (SFFs) that resulted from compression architecture, which is absent in scan mode. The SFFs have uncompressible values logic‐0 and logic‐1 in many or most of the patterns contribute to the TDV. In the proposed new scan compression (NSC) architecture, SFFs are analysed from Automatic Test Pattern Generation (ATPG) patterns generated in a scan mode. The identification of SFFs to be moved out of the compression architecture is carried out based on the NSC. The method includes a ranking of SFFs based on the specified values present in the test patterns. The SFFs having higher specified values are moved out of the compression architecture and placed in the outside scan chain. The NSC is the combination of scan compression and scan mode. This method decides the percentage (%) of SFFs to be moved out of compression architecture and is less than 0.5% of the total SFFs present in the design to achieve a better result. The NSC reduces dependencies across the SFFs present in the test compression architecture. It reduces the TDV and test application time. The results show a significant reduction in the TDV up to 78.14% for the same test coverage.

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“…One of the most effective schemes for reducing test data volume is test data compression, where test data provided by the vendor are stored in the memory of a tester, and an on-chip decoder is used to apply the corresponding test vectors to circuits under test (CUT). Many test compression schemes have been proposed in recent decades, and they can be classified into three categories: code-based compression scheme [4,5], linear decompression-based scheme [6,7], and broadcast-scan-based scheme [8,9]. Code-based compression schemes encode for pre-computed test data; linear decompression-based schemes use a linear decompression module to apply test data to CUTs; and broadcast-scan-based schemes broadcast identical test data to multiple scan cells at the same time.…”

Section: Introductionmentioning

confidence: 99%

A new test set compression scheme for circular scan

2018

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A new test data compression scheme for circular scan is proposed in this paper. For circular scan, the response of the previous test vector is used as the next test vector's template, and only the conflicting bits between the previous response and the next vector are required to be updated. To reduce the test data volume and test application time, the problem addressed here is minimizing the number of conflicting bits by optimally reordering test vectors. Each vector represents a city, and the number of conflicting bits between two test vectors is regarded as the distance between them. Thus, the problem corresponds to the travelling salesman problem (TSP), which is NP-complete. The genetic algorithm is used to solve this problem. The experimental results show that the proposed scheme could reduce the test data volume efficiently without any additional hardware cost.

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Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios

Cited by 6 publications

References 20 publications

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

On Reducing Test Data Volume for Circular Scan Architecture Using Modified Shuffled Shepherd Optimization

New scan compression approach to reduce the test data volume

A new test set compression scheme for circular scan

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