IEEE 8th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No.99TH8412)
DOI: 10.1109/epep.1999.819222
|View full text |Cite
|
Sign up to set email alerts
|

Equivalent circuit modeling of single and coupled on-chip interconnects on lossy silicon substrate

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
5
0

Publication Types

Select...
4
2

Relationship

1
5

Authors

Journals

citations
Cited by 10 publications
(5 citation statements)
references
References 6 publications
0
5
0
Order By: Relevance
“…The equivalent-circuit model for the p.u.l. series impedance is derived by constructing a rational function with forced passivity from the computed frequency-dependent series impedance [16]. The approximating rational function has the general form (13) and can be synthesized in terms of ideal and elements in a ladder-type canonical topology [17]- [19] as shown in Fig.…”
Section: A Single Interconnectmentioning
confidence: 99%
See 2 more Smart Citations
“…The equivalent-circuit model for the p.u.l. series impedance is derived by constructing a rational function with forced passivity from the computed frequency-dependent series impedance [16]. The approximating rational function has the general form (13) and can be synthesized in terms of ideal and elements in a ladder-type canonical topology [17]- [19] as shown in Fig.…”
Section: A Single Interconnectmentioning
confidence: 99%
“…series impedances are represented by lumped elements. Consider the differential voltages in the transmission line equations for two coupled lines (16) (17) where and are the voltages and currents on the two lines, respectively, and , are the p.u.l. self and mutual impedances.…”
Section: B General Asymmetric Coupled Interconnectsmentioning
confidence: 99%
See 1 more Smart Citation
“…In [7,8], an equivalent circuit model with frequency-dependent components were described. A quasi-magnetostatic integral formulation approach was used for the computation of the component values.…”
Section: Introductionmentioning
confidence: 99%
“…the speed, area, reliability, and yield of next generation IC and MCM circuits [1]- [4], [6]- [8]. To avoid problems with the interconnection lines and thereby to increase the transmission bandwidth of sub-nanosecond digital signals through the interconnection lines, transmission line structures are required.…”
mentioning
confidence: 99%