Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. <b>5</b>
                  <b>3</b>, 1045 (1988)]

Meyer, Gerhard; Amer, Nabil M.

doi:10.1063/1.100425

Cited by 340 publications

(214 citation statements)

References 7 publications

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“…The set-up of our SFM is based on the beam-deflection principle [28] and equals the design of Howald et al [29]. The dynamic mode of the SFM is realized as described in [30] and further characterized in [31,32].…”

Section: Imaging Modesmentioning

confidence: 99%

Imaging nanoclusters in theconstant height modeof the dynamic SFM

et al. 2006

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For the first time, high quality images of metal nanoclusters which were recorded in the constant height mode of a dynamic scanning force microscope (dynamic SFM) are shown. Surfaces of highly ordered pyrolytic graphite (HOPG) were used as a test substrate since metal nanoclusters with well defined and symmetric shapes can be created by epitaxial growth. We performed imaging of gold clusters with sizes between 5 and 15 nm in both scanning modes, constant f mode and constant height mode, and compared the image contrast. We notice that clusters in constant height images appear much sharper, and exhibit more reasonable lateral shapes and sizes in comparison to images recorded in the constant f mode. With the help of numerical simulations we show that only a microscopically small part of the tip apex (nanotip) is probably the main contributor for the image contrast formation. In principle, the constant height mode can be used for imaging surfaces of any material, e.g. ionic crystals, as shown for the system Au/NaCl(001).

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Section: Imaging Modesmentioning

confidence: 99%

Imaging nanoclusters in theconstant height modeof the dynamic SFM

et al. 2006

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“…It has been operated in air [l], water [2], ultra-high vacuum (UHV) [3], liquid helium [4] and UHV at liquid-helium temperature [5]. Recently the AFM has been used to study electrochemical deposition processes on the atomic scale [6].…”

Section: Introductionmentioning

confidence: 99%

Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

Giessibl¹,

Binnig²

1992

Ultramicroscopy

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We have imaged the (001) surface of KBr with a UHV atomic force microscope at 4.2 K and 300 K. The sample was prepared by cleaving it in UHV along the (001) plane. We achieved atomic resolution at 4.2 K and resolved both the potassium and the bromium ions. We show atomically resolved images of flat terraces as large as 25 nm by 25 nm. Force-versus-distance measurements were taken, and the influence of the loading force acting between sample and cantilever on the appearance of friction effects and sample damage was studied.

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“…The deflection of the cantilever is usually measured using the optical lever technique [28,29]. A beam from a laser diode is focused onto the end of the cantilever and the position of the reflected beam is monitored by a position sensitive detector (PSD).…”

Section: Overviewmentioning

confidence: 99%

“…The deflection of the cantilever is usually measured using the optical lever technique [28,29] (Fig. 9).…”

Section: Deflection Detection With An Optical Levermentioning

confidence: 99%

Force measurements with the atomic force microscope: Technique, interpretation and applications

Butt

Cappella

Kappl

2005

Surface Science Reports

3,246

2,949

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Erratum: Novel optical approach to atomic force microscopy [Appl. Phys. Lett. 5 3, 1045 (1988)]

Cited by 340 publications

References 7 publications

Imaging nanoclusters in theconstant height modeof the dynamic SFM

Imaging nanoclusters in theconstant height modeof the dynamic SFM

Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

Force measurements with the atomic force microscope: Technique, interpretation and applications

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