Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

Giessibl, Franz J.; Binnig, G.

doi:10.1016/0304-3991(92)90280-w

Cited by 90 publications

(33 citation statements)

References 21 publications

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“…The bare ionic radius is r Br = 195 pm for the Br − ions and r K = 133 pm for the K + ions. 28 Following earlier publications, only the large Br − ions should be visible. .…”

Section: B Sample: Potassium Bromidementioning

confidence: 99%

Optimizing atomic resolution of force microscopy in ambient conditions

2013

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Ambient operation poses a challenge to atomic force microscopy because in contrast to operation in vacuum or liquid environments, the cantilever dynamics change dramatically from oscillating in air to oscillating in a hydration layer when probing the sample. We demonstrate atomic resolution by imaging of the KBr(001) surface in ambient conditions by frequency-modulation atomic force microscopy with a cantilever based on a quartz tuning fork (qPlus sensor) and analyze both long-and short-range contributions to the damping. The thickness of the hydration layer increases with relative humidity; thus varying humidity enables us to study the influence of the hydration layer thickness on cantilever damping. Starting with measurements of damping versus amplitude, we analyzed the signal and the noise characteristics at the atomic scale. We then determined the optimal amplitude which enabled us to acquire high-quality atomically resolved images.

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“…The bare ionic radius is r Br = 195 pm for the Br − ions and r K = 133 pm for the K + ions. 28 Following earlier publications, only the large Br − ions should be visible. .…”

Section: B Sample: Potassium Bromidementioning

confidence: 99%

Optimizing atomic resolution of force microscopy in ambient conditions

2013

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“…The atomic rows of the KBr lattice are clearly resolved; the resolution perpendicular to these rows is less prominent. Nevertheless, the square lattice, which is typically denoted to the bromine ions 21 due to their larger ionic radius, can clearly be resolved.…”

Section: Resultsmentioning

confidence: 99%

Design of a ‘‘beetle-type’’ atomic force microscope using the beam deflection technique

Gasser

Menck

Brune

et al. 1996

Review of Scientific Instruments

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In the present article we describe a new setup for an atomic force microscope in the beetle-type geometry. The microscope consists of a compact head standing on three piezo legs with a fourth central piezo carrying the cantilever tip. We use the laser beam deflection method to detect the deflection of the cantilever. All optical components are integrated into the microscope head which has a diameter of 40 mm. This compactness results in a high mechanical stability, while the adjustment of the optical pathway is still easy to handle. The microscope can be used in UHV and in air. Measurements on KBr͑100͒ in air show the capability of the microscope to obtain a resolution up to atomic corrugations.

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“…Another reason for damping in the condensation layer are hydrodynamic friction forces which could also contribute to energy dissipation that occurs when the water layer that separates tip and sample is expelled and drawn in by the oscillating tip (Labuda et al, 2013). Literature values of hydration layers are available on various samples like metal and oxides (Hodgson & Haq, 2009), ionic crystals like calcite (Cleveland, Sch€ affer, & Hansma, 1995;Giessibl & Binnig, 1992), mica (Cheng, Fenter, Nagy, Schlegel, & Sturchio, 2001;Israelachvili & Pashley, 1983;Jeffery et al, 2004;Park & Sposito, 2002) and alkali halide surfaces (F€ olsch & Henzler, 1991;F€ olsch, Stock, & Henzler, 1992;Imada et al, 2013;Meyer, Entel, & Hafner, 2001;Park, Cho, & Kim, 2004;Wassermann, Mirbt, Reif, Zink, & Matthias, 1993).…”

Section: Damping By the Condensation Layermentioning

confidence: 99%

“…Structural information are appropriated for comparison with literature. Literature values of hydration layers are available on various samples like metal and oxides (Hodgson & Haq, ), ionic crystals like calcite (Cleveland, Schäffer, & Hansma, ; Giessibl & Binnig, ), mica (Cheng, Fenter, Nagy, Schlegel, & Sturchio, ; Israelachvili & Pashley, ; Jeffery et al, ; Park & Sposito, ) and alkali halide surfaces (Fölsch & Henzler, ; Fölsch, Stock, & Henzler, ; Imada et al, ; Meyer, Entel, & Hafner, ; Park, Cho, & Kim, ; Wassermann, Mirbt, Reif, Zink, & Matthias, ).…”

Section: Introductionmentioning

confidence: 99%

Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1

Wastl

2016

Microscopy Res & Technique

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Atomic force microscopy (AFM) is an enormous tool to observe nature in highest resolution and understand fundamental processes like friction and tribology on the nanoscale. Atomic resolution in highest quality was possible only in well-controlled environments like ultrahigh vacuum (UHV) or controlled buffer environments (liquid conditions) and more specified for long-term high-resolution analysis at low temperatures (∼4 K) in UHV where drift is nearly completely absent. Atomic resolution in these environments is possible and is widely used. However, in uncontrolled environments like air, with all its pollutants and aerosols, unspecified thin liquid films as thin as a single molecular water-layer of 200 pm or thicker condensation films with thicknesses up to hundred nanometer, have been a problem for highest resolution since the invention of the AFM. The goal of true atomic resolution on hydrophilic as well as hydrophobic samples was reached recently. In this manuscript we want to review the concept of ambient AFM with atomic resolution. The reader will be introduced to the phenomenology in ambient conditions and the problems will be explained and analyzed while a method for scan parameter optimization will be explained. Recently developed concepts and techniques how to reach atomic resolution in air and ultra-thin liquid films will be shown and explained in detail, using several examples. Microsc. Res. Tech. 80:50-65, 2017. © 2016 Wiley Periodicals, Inc.

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Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum

Cited by 90 publications

References 21 publications

Optimizing atomic resolution of force microscopy in ambient conditions

Optimizing atomic resolution of force microscopy in ambient conditions

Design of a ‘‘beetle-type’’ atomic force microscope using the beam deflection technique

Ambient atomic resolution atomic force microscopy with qPlus sensors: Part 1

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