Estimation of High-Frequency Currents From Near-Field Scan Measurements

Weng, Haixiao; Beetner, Daryl G.; DuBroff, R.E.; Shi, Jin

doi:10.1109/temc.2007.908264

Cited by 48 publications

(19 citation statements)

References 14 publications

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“…j n (ρ) and h (2) n (ρ) are the first kind spherical Bessel function and second kind spherical Hankel function, respectively. The superscript (1) in (9) and (10) denotes that in (7) and (8) B n (kr) = h (2) n (kr), which represents outgoing waves; otherwise, B n (kr) = j n (kr) for standing waves when r → 0. In the far field region, approximations can be made as follows [20] …”

Section: Dyadic Green's Function For a Pec Spherementioning

confidence: 99%

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The Far Field Transformation for the Antenna Modeling Based on Spherical Electric Field Measurements

Li¹,

Jiang

2012

PIER

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Abstract-According to the uniqueness theorem, the far field radiation pattern of radiators such as antennas can be determined from the measured tangential electric or magnetic field components over an arbitrary Huygens' surface enclosing the radiator. In this paper, a method using the spherical electric field measurement is developed to calculate the far field radiation. Following the Schelkunoff's field equivalence principle, a spherical region surrounding the radiator is assumed and its internal space is filled up with the perfect electric conductor (PEC). The radiated field from the Huygens' equivalent electric current is zero. Referring to the Ohm-Rayleigh method and the scattering wave superposition, the dyadic Green's function (DGF) with the presence of a PEC sphere is expanded by a series of spherical vector wave functions. Based on the DGF and the measured tangential electric field, the radiation behavior of the radiator can be directly predicted without involving the uncertainty from the inverse process. The robustness and accuracy of the proposed method are verified through several canonical antenna benchmarks.

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Section: Dyadic Green's Function For a Pec Spherementioning

confidence: 99%

“…Besides, the near field data contains very useful information for antenna diagnostics [2]. Traditional near-field far-field transformation (NF-FF) algorithms employ a set of equivalent sources that could be electric/magnetic dipoles, electric/magnetic current sources, or plane waves, etc..…”

Section: Introductionmentioning

confidence: 99%

The Far Field Transformation for the Antenna Modeling Based on Spherical Electric Field Measurements

Li¹,

Jiang

2012

PIER

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“…Followed by the near field data post processing, advanced near field measurement techniques are broadly applied to antenna diagnostics [1], far field (FF) prediction, and radiation pattern synthesis [2][3][4], etc.. Because the near field (NF) data contains intrinsic information for antenna characterizations [5], the source reconstruction methods (SRM) are employed to recover the near field equivalent sources so that the near field radiation mechanism as well as the far field radiation pattern can be analyzed.…”

Section: Introductionmentioning

confidence: 99%

“…It is calculated from the measured planar electric field over a near field plane. A similar idea is proposed in [5], in which the equivalent source is a set of planar electric currents over a perfect magnetic conductor (PMC) plane. The PMC plane can be further eliminated via the image theory.…”

Section: Introductionmentioning

confidence: 99%

An Iterative Source Reconstruction Method Exploiting Phaseless Electric Field Data

Li¹,

Jiang²

2013

PIER

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Abstract-Conventional equivalent source reconstruction methods (SRM) require both phase and amplitude information of the acquired field data. However, there are situations where the phase information is not available or impractical to obtain. Hence, the development of SRM using phaseless fields is important. In this paper, a novel iterative SRM based on phaseless electric fields is presented. The reconstructed equivalent current source can be electric, magnetic current, or both. They can fit the physical geometry of the radiator. Electric field integral equation (EFIE) is employed to build the relationship between the reconstructed current source and measured fields. It can precisely reproduce the original 3D radiation pattern with very good accuracy. To investigate the robustness and accuracy of the proposed approach, both strong and weakly-directional radiators are benchmarked.

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“…Measuring electric or magnetic field emitted by microelectronic components is a part of EMC research and near field modeling [2][3][4]. Equivalent sources for electromagnetic circuits diagnostics and characterization can also be used to predict the field radiated by the device under test.…”

Section: Introductionmentioning

confidence: 99%

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

David¹,

Baudry²,

Louis³

2012

PIER B

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Abstract-In this paper, two different kinds of near-field measurement techniques are presented. The first one uses coaxial probes that do not give precise measurements on microelectronic devices. We saw in [1] that the spatial resolution of these probes reaches 500 µm for monopole and is millimetric for dipole probe. The second one is based on the Pockels effect that converts an electromagnetic (EM) field into optical modulation. Our objective is to improve the E x /E y near-field measurement with this second technique. The performance of the electro-optic (EO) probe is compared with dipole probes of 2.5 and 5 mm with the use of simulations and measurements, on a wire above a ground plane and on coupled microstrip lines. At the end, a discussion about the technical limitations of the EO probe is made.

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Estimation of High-Frequency Currents From Near-Field Scan Measurements

Cited by 48 publications

References 14 publications

The Far Field Transformation for the Antenna Modeling Based on Spherical Electric Field Measurements

The Far Field Transformation for the Antenna Modeling Based on Spherical Electric Field Measurements

An Iterative Source Reconstruction Method Exploiting Phaseless Electric Field Data

Improvement of Electrical Near-Field Measurements With an Electro-Optic Test Bench

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