2013
DOI: 10.1016/j.tsf.2013.09.073
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Eutaxial growth of hematite Fe2O3 films on perovskite SrTiO3 polycrystalline substrates

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Cited by 16 publications
(42 citation statements)
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References 28 publications
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“…Color variations between the film and substrate (see the purple/pink pair within the white boxes) are usually within a few degrees of each other on the color key shown in Fig. 1(c), and small angular misorientations such as these have been observed previously in CSE grown films 10,12 and are expected to relieve misfit strains in the heterostructures. 23 The in-plane (IP) alignments between the substrate and grain exhibited identical characteristics to the out-of-plane (OP) alignments discussed here.…”
supporting
confidence: 56%
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“…Color variations between the film and substrate (see the purple/pink pair within the white boxes) are usually within a few degrees of each other on the color key shown in Fig. 1(c), and small angular misorientations such as these have been observed previously in CSE grown films 10,12 and are expected to relieve misfit strains in the heterostructures. 23 The in-plane (IP) alignments between the substrate and grain exhibited identical characteristics to the out-of-plane (OP) alignments discussed here.…”
supporting
confidence: 56%
“…Here, we develop further a high-throughput synthesis process (called combinatorial substrate epitaxy, or CSE) where an oxide film is grown epitaxially on a polycrystalline substrate, [8][9][10][11][12] which should allow functional properties to be investigated across the entirety of epitaxial orientation space. Prior work using CSE has focused on understanding growth of non-isostructural film-substrate pairs, 8,9,11,12 engineering phase stability in complex materials, 10 and establishing the role of substrate and film phase/orientation on photochemistry.…”
mentioning
confidence: 99%
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“…In CSE, polished polycrystalline substrates are used, which can be prepared in‐house for a wide range of structural families, and each grain of the substrate can be viewed as a single crystal with a unique orientation. Electron backscatter diffraction (EBSD) is used in CSE as a high‐throughput local structural probe to create phase and orientation maps across large areas of the substrate surface, as well as the deposited film . A single deposition of a film onto a polycrystalline substrate yields thousands of observations from which a broad understanding of phase stability and film‐substrate orientation relationships (ORs) can be developed.…”
Section: Introductionmentioning
confidence: 99%
“…A single deposition of a film onto a polycrystalline substrate yields thousands of observations from which a broad understanding of phase stability and film‐substrate orientation relationships (ORs) can be developed. For example, only a few ORs were found for epitaxial films on polycrystalline substrates across all of orientation space of the substrate . One common preferred epitaxial orientation (PEO) is called the eutactic OR, which aligns the eutactic (or nearly close‐packed) planes and directions between the film and substrate .…”
Section: Introductionmentioning
confidence: 99%