Evaluating ate-equipment for volume diagnosis

Arnold, R.; Leininger, A.

doi:10.1109/test.2005.1584073

Cited by 6 publications

(2 citation statements)

References 5 publications

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“…This test time increase is considered as negligible. Keeping in mind that scan diagnosis data collection in an ATE log-file may increase the scan test time by a factor of 20X, as already mentioned in the introduction [12]. Because decoding of diagnosis data will be done offline, decoding is not considered as extra test time.…”

Section: Additional Test Timementioning

confidence: 99%

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On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture

Poehl

Rzeha

Beck

et al.

Eleventh IEEE European Test Symposium (ETS'06)

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Section: Additional Test Timementioning

confidence: 99%

“…This limit might be easily reached if many devices are tested in parallel in a multi-site test approach. Moreover, recording fail information during scan test can lead to a dramatic increase in scan test time of more than 20X [12].…”

Section: Introductionmentioning

confidence: 99%

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture

Poehl

Rzeha

Beck

et al.

Eleventh IEEE European Test Symposium (ETS'06)

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The Next Step in Volume Scan Diagnosis: Standard Fail Data Format

Leininger¹,

Khoche²,

Fischer³

et al. 2006

2006 15th Asian Test Symposium

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The need for faster and more reliable yield ramp-up when introducing new CMOS technologies is driving the effort to acquire and analyze valuable information from production test, for the process of identification of yield detractors. This paper addresses a key step in the phase of "industrialization" of these processes: standardization. The objective of standardization is to enable a seamless flow for production integrated scan diagnosis in a multitool, multi-vendor environment. To make analysis of chips failing the production test more efficient, a process flow and a file format to store the failing response of the chips is proposed. This will enable a smooth exchange of production test data from ATE to diagnosis, failure analysis, design and process.

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