2000
DOI: 10.1116/1.1321759
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Evaluation of alternative development process for high-aspect-ratio poly(methylmethacrylate) microstructures in deep x-ray lithography

Abstract: The development of very thick commercial sheets of poly(methyl methacrylate) (PMMA) resist patterned by deep x-ray lithography was investigated. The development characteristics were explored, with the alternative methyl-iso-butyl-ketone (MIBK)-based developer systems, MIBK and MIBK/ iso-propyl-alcohol (IPA) 1:3, being compared with the “GG” developer system (2-butoxyethoxy-ethanol, morpholine, 2-aminoethanol, and water) more generally used. In particular, the influence of various parameters were studied: PMMA … Show more

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Cited by 13 publications
(6 citation statements)
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“…Development can be accelerated by moderately increasing the temperature of the developing solution, 26 reducing the exposure time and consequently the cross-linking degree, 27 or agitation. Stirring of the developer solution enhances diffusion, which increases the development rate.…”
Section: Long Development Timesmentioning
confidence: 99%
“…Development can be accelerated by moderately increasing the temperature of the developing solution, 26 reducing the exposure time and consequently the cross-linking degree, 27 or agitation. Stirring of the developer solution enhances diffusion, which increases the development rate.…”
Section: Long Development Timesmentioning
confidence: 99%
“…Typical exposures were carried out at 100 mA beam current, providing a total estimated dose of 8,000-12,000 joules/cc in 8-12 hours. After exposure, the sheets of PMMA were developed and rinsed at 25°C in the GG development system, 9,10 until the lens structures were developed through. The developed sheets were dried after a final deionized water rinse.…”
Section: Lens Fabricationmentioning
confidence: 99%
“…Poly͑methyl methacrylate͒ ͑PMMA͒ is a transparent thermoplastic with important applications as a positive resist for various radiation sources, such as electron beam lithography, [1][2][3][4][5] x-ray lithography, [6][7][8][9][10][11][12] and deep-UV lithography. 13 Radiation sensitivity is due to polymer chain scissions caused by the absorbed radiation.…”
Section: Introductionmentioning
confidence: 99%
“…2,3,10 Another commonly used developer is GG developer, [7][8][9][10][11][12] which is a mixture of water, butoxyethoxyethanol, tetrahydro-oxazine, and aminoethanol. Popular solvent systems involve cosolvent mixtures of methyl isobutyl ketone ͑MIBK͒ and isopropanol ͑IPA͒, 2,3,5,8,10 and cosolvent mixtures of IPA and water.…”
Section: Introductionmentioning
confidence: 99%