1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)
DOI: 10.1109/ectc.1998.678899
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Evaluation of solder joint reliability between PWB and CSP by using high TCE ceramic material

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Cited by 3 publications
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“…The packages then were mounted on the IC integration area of LTCC-M back panel to electrically connect to the address electrodes. On the other hand, the reliability between the interposer and the main board is deeply influenced by CTE difference of them which usually causes to the failure of BGA connections [3].…”
Section: Driver Ic Integrationmentioning
confidence: 99%
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“…The packages then were mounted on the IC integration area of LTCC-M back panel to electrically connect to the address electrodes. On the other hand, the reliability between the interposer and the main board is deeply influenced by CTE difference of them which usually causes to the failure of BGA connections [3].…”
Section: Driver Ic Integrationmentioning
confidence: 99%
“…The interposers were consisted of 3 different conductor pattern layers for wire-bonding and BGA packaging [3]. The photographs The wire-bonded topside was encapsulated by epoxy resin to protect from the severe environments.…”
Section: Number Of Ltcc Layersmentioning
confidence: 99%