Experimental results from I/sub DDF/ testing

Thibeault, Claude; Payeur, Alexandre

doi:10.1109/dftvs.1996.572024

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Frequency Spectrum Analysis Of Dynamic Current1

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“…Thibeault proposed sampling the I DD waveform several times per clock cycle to extract more information from the signal than the simple DC level used in I DDQ test [Thibeault 1995;Thibeault and Payeur 1996]. Figure 21 shows the overview of this method called I DDF testing.…”

Section: Frequency Spectrum Analysis Of Dynamic Currentmentioning

confidence: 99%

I_DDX-based test methods

Sabade

Walker

2004

ACM Trans. Des. Autom. Electron. Syst.

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Supply current measurement-based test is a valuable defect-based test method for semiconductor chips. Both static leakage current (I DDQ ) and transient current (I DDT ) based tests have the capability of detecting unique defects that improve the fault detection capacity of a test suite. Collectively these test methods are known as I DDX tests. However, due to advances in the semiconductor manufacturing process, the future of these test methods is uncertain. This paper presents a survey of the research reported in the literature to extend the use of I DDX tests to deep sub-micron (DSM) technologies.

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Section: Frequency Spectrum Analysis Of Dynamic Currentmentioning

confidence: 99%