Extraction of Drain Current Thermal Noise in a 28 nm High-&lt;inline-formula&gt; 
                     &lt;tex-math notation="LaTeX"&gt;${k}$ &lt;/tex-math&gt;
                  &lt;/inline-formula&gt;/Metal Gate RF CMOS Technology

Zhang, Huaiyuan; Niu, Guofu; Liang, Qi; Imura, Keiichiro

doi:10.1109/ted.2018.2820698

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Extraction of Drain Current Thermal Noise in a 28 nm High-<inline-formula> <tex-math notation="LaTeX">${k}$ </tex-math> </inline-formula>/Metal Gate RF CMOS Technology

Cited by 4 publications

References 24 publications

Design and Analysis of a 4.2 mW 4 K 6–8 GHz CMOS LNA for Superconducting Qubit Readout

Design and Analysis of a 4.2 mW 4 K 6–8 GHz CMOS LNA for Superconducting Qubit Readout

Thermal Noise Measurement and Characterization for Modern Semiconductor Devices

22nm Ultra-Thin Body and Buried Oxide FDSOI RF Noise Performance

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