1996
DOI: 10.1016/s0040-6090(96)08824-4
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Fabrication and characterization of ITO thin films deposited by excimer laser evaporation

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Cited by 102 publications
(30 citation statements)
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“…This bombardment gives additional energy to the molecules and clusters condensed on a substrate and peels off molecules that are bonded only weakly to the film [19,20]. However, when the film thickness reaches 210 nm, the lattice constant increases sharply, indicating that the film contains many growth-induced defects [21].…”
Section: Methodsmentioning
confidence: 99%
“…This bombardment gives additional energy to the molecules and clusters condensed on a substrate and peels off molecules that are bonded only weakly to the film [19,20]. However, when the film thickness reaches 210 nm, the lattice constant increases sharply, indicating that the film contains many growth-induced defects [21].…”
Section: Methodsmentioning
confidence: 99%
“…ITO is an n-type semiconductor with a wide band gap between 3.3 and 4.3 eV at room temperature with a bixbyte structure. A range of methods, such as various types of sputtering, evaporation, plasma-assisted electron beam evaporation, and chemical vapor deposition (CVD) [6][7][8], have been used to deposit ITO films to optimize the electrical and optical properties of the ITO films. In particular, magnetron sputtering has attracted considerable attention as a reliable tool for depositing thin films and surface modification owing to the high deposition rates, easy to adjust sputtering parameters, and the good film quality.…”
Section: Introductionmentioning
confidence: 99%
“…Indium tin oxide (ITO) film is the most widely used TCO film due to its high transparency, low resistivity and high work function [5,6]. However, ITO film is not stable and shows degradation at temperatures above 700 K [7,8]. Zinc oxide (ZnO) is a promising alternative to ITO in TCOs applications due to its thermally stability [9], non-toxicity, low cost and abundance.…”
Section: Introductionmentioning
confidence: 99%