“…By this process, in general, stoichiometric composition of the deposited materials can be maintained as transferred from source to substrate [7]. In the present study, the characterization and leakage current density of SrTiO 3 thin films deposition on Pt/Ti/SiO 2 /Si substrates prepared at 500 C by RF magnetron sputtering were investigated using X-ray diffraction (XRD), scanning electron microscope (SEM), scanning transmission electron microscope (STEM), electron diffraction (ED), profilometer, capacitance-voltage, and current-voltage measurement.…”